M. N. Sorokovikov, D. A. Zverev, A. A. Barannikov, A. L. Astafyev, I. B. Panormov, V. A. Yunkin, A. Y. Seregin, Y. A. Volkovskiy, P. A. Prosekov, A. A. Snigirev
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Abstract
The paper focuses on developing, manufacturing, and testing a two-dimensional X-ray focusing device based on silicon planar compound refractive lenses. Using compound refractive lenses installed in cross geometry one after another along the optical axis allows for generating a beam with specified parameters. A distinctive feature of the developed device is the ability to correct astigmatism of the optical system. Two-dimensional focusing of X-ray radiation with astigmatism correction was experimentally demonstrated at the RKFM beamline “KISI–Kurchatov.” The resulting focused X-ray beam, characterized using the knife-edge technique, had a size of approximately 1.5 µm, with equal dimensions in both the vertical and horizontal directions. The experimental results were compared with theoretical estimates and computer simulations.
期刊介绍：
Nanobiotechnology Reports publishes interdisciplinary research articles on fundamental aspects of the structure and properties of nanoscale objects and nanomaterials, polymeric and bioorganic molecules, and supramolecular and biohybrid complexes, as well as articles that discuss technologies for their preparation and processing, and practical implementation of products, devices, and nature-like systems based on them. The journal publishes original articles and reviews that meet the highest scientific quality standards in the following areas of science and technology studies: self-organizing structures and nanoassemblies; nanostructures, including nanotubes; functional and structural nanomaterials; polymeric, bioorganic, and hybrid nanomaterials; devices and products based on nanomaterials and nanotechnology; nanobiology and genetics, and omics technologies; nanobiomedicine and nanopharmaceutics; nanoelectronics and neuromorphic computing systems; neurocognitive systems and technologies; nanophotonics; natural science methods in a study of cultural heritage items; metrology, standardization, and monitoring in nanotechnology.
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