Peng Gu , Yunxiang Zhou , Chenchen Sun , Zhongjin Luo , Zhenhua Jiang , Zhuoqi Shi
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引用次数: 0
Abstract
Magnesium aluminate spinel is utilized in aerospace, optics, and electronics due to its optical properties, strength, thermal stability, and corrosion resistance. Ultra-precision grinding delivers superior surface finishing, optimal for hard and brittle substances. Surface quality after ultra-precision grinding affects optical performance significantly. In this paper, the material removal mechanism of magnesium aluminate spinel is investigated. A comprehensive method for evaluating the three-dimensional surface after ultra-precision grinding is proposed, which clearly describes the distribution of surface states. Surface error indicators are suggested for the plasticity and brittleness domain of ground surfaces. Additionally, three-dimensional surface analysis of magnesium aluminate spinel after ultra-precision grinding is performed utilizing Fourier transform. The optimized ultra-precision grinding process parameters by the firefly algorithm are obtained as ns = 20200 r·min−1, vw = 1.2 mm min−1, ap = 1.5 μm. The mid-frequency surface roughness is 0.015 μm, and the profile height is 0.23 μm. This research achieves an optimal balance between grinding efficiency and surface quality, offering guidelines for the grinding processes for other brittle and hard materials.
期刊介绍:
Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.