Combination-Encoding Content-Addressable Memory Utilizing the Ferroelectric Hf-Zr-O Field-Effect-Transistor Array

IF 4.3 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Manh-Cuong Nguyen, Eun Chan Park, Rino Choi*, Doo Seok Jeong* and Daewoong Kwon*, 
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引用次数: 0

Abstract

We fabricated an Hf-Zr-O (HZO) ferroelectric field-effect transistor (FeFET) array as a combination-encoding content-addressable memory (CECAM), offering higher content density than other ternary content-addressable memories (TCAM). Considering the robust nonvolatile memory behavior of FeFETs and efficient parallel searching ability through combination-encoding, the CECAM fabricated with the HZO FeFET array is a suitable candidate for next-generation searching engines. Additionally, it offers advantages such as negligible standby power, optimal matching, high content density, and significantly reduced operation power (mismatch power). The average mismatch power per bit per switch in CECAM significantly decreased with increasing size, with reductions of up to 65% for CECAMs containing more than eight FeFETs compared to TCAMs using the same FeFETs. We developed a calculation model to estimate CECAM matching current and power consumption based on the characteristics of a single FeFET, enabling performance prediction from early research stages and facilitating CECAM circuit design.

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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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