Ionic Capacitive Pressure Sensor with Enhanced Sensitivity and Broad Detection Range Featuring Hierarchical Microridge Design

IF 4.3 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Yuxiang Qin*, Xinyu Wang and Bo Gao, 
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Abstract

Sensitivity and detection range are pivotal attributes in the design of flexible pressure sensors. Nonetheless, maintaining a high sensitivity across a wide detection range remains a difficult challenge. In response to this concern, we propose an ionic capacitive flexible pressure sensor that combines an electron double layer mechanism with hierarchical microridge structure. Experimentally, hierarchical microridge structures are fabricated by a low-cost etched polysilicon template method. The sensor demonstrates high sensitivity and segmented linearity over a wide pressure detection range. Within the pressure range of up to 193.06 kPa, the sensor demonstrates a maximum sensitivity of 119.05 kPa–1 and a maximum linearity of 0.9876. Benefiting from the broad detection range, high sensitivity, and linearity, practical applications around human motion monitoring such as joint motions and pulse detection are demonstrated here. This work provides a strategy for developing capacitive, flexible pressure sensors with high sensitivity over a wide pressure detection range.

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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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