A 9-GHz Low-In-Band Noise Sub-Sampling-Chopper PLL With Charge-Share Canceling Technique

IF 4.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Xiangjian Kong;Kai Xu;Huanlin Xie;Mingchao Jian;Hao Lian;Robert Bogdan Staszewski;Chunbing Guo
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引用次数: 0

Abstract

This article presents a low-jitter sub-sampling chopper phase-locked loop (SS-CPLL) that incorporates a novel chopping charge pump (C-CP) to mitigate 1/f noise in short-channel devices operating at a low supply voltage of 0.75 V. A charge-share cancellation technique is introduced to suppress ripple generated by residual charge from the previous reference period. The chopping modulation further reduces the charge pump’s white noise by filtering out high-order harmonics of folded noise, thereby significantly lowering in-band noise. In addition, a high-swing class-C/F2 voltage-controlled oscillator (VCO) is proposed to optimize out-of-band noise while maintaining low power consumption. Fabricated in 65-nm complementary metal oxide semiconductor (CMOS) with a core area of 0.64 mm2, the SS-CPLL achieves an in-band phase noise of −111.9 dBc/Hz at 1-kHz offset, an integrated jitter of 49.9 fs, and a figure-of-merit (FoM) of −257.1 dB at 9 GHz, while consuming 7.8 mW of power. The proposed SS-CPLL reduces in-band noise by approximately 15 dB compared with a conventional sub-sampling phase-locked loop (SSPLL), while maintaining a similar reference spur level of −58 dBc/Hz. This highlights the effectiveness of the C-CP and charge-share cancellation techniques.
一种采用电荷分担抵消技术的9ghz低带内噪声子采样斩波锁相环
本文提出了一种低抖动子采样斩波锁相环(SS-CPLL),该环采用了一种新型斩波电荷泵(C-CP),可在工作在0.75 V低电源电压下的短通道器件中降低1/f噪声。采用电荷共享抵消技术抑制前一参考时段的剩余电荷产生的纹波。斩波调制通过滤除折叠噪声中的高次谐波进一步降低电荷泵的白噪声,从而显著降低带内噪声。此外,提出了一种高摆幅c类/F2级压控振荡器(VCO),以优化带外噪声,同时保持低功耗。SS-CPLL采用65纳米互补金属氧化物半导体(CMOS)制造,核心面积为0.64 mm2,在1 khz偏置时的带内相位噪声为- 111.9 dBc/Hz,集成抖动为49.9 fs,在9 GHz时的品质因数(FoM)为- 257.1 dB,功耗为7.8 mW。与传统的次采样锁相环(SSPLL)相比,所提出的SS-CPLL可将带内噪声降低约15 dB,同时保持相似的参考杂散电平- 58 dBc/Hz。这突出了C-CP和电荷份额抵消技术的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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