Optimizing value prediction for ILP processors: A design space exploration approach

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Ling Yang, Zhong Zheng, Libo Huang, Run Yan, Sheng Ma, Yongwen Wang, Weixia Xu
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引用次数: 0

Abstract

Value prediction is a microarchitectural technique that enhances processor performance by speculatively breaking true data dependencies. It has demonstrated improved performance in both single-threaded and multi-threaded workloads, rendering it an appealing microarchitectural approach. While high-performance value predictors can achieve impressive accuracy, they may also incur significant costs in terms of area, power consumption, and complexity. Therefore, there is a demand for lightweight value prediction techniques capable of striking a favorable balance between performance and overhead. However, designing value predictors with superior performance using limited resources presents an urgent challenge, as inappropriate parameter configurations may result in cost overruns and degraded processor performance. Consequently, this work proposes a design space exploration framework for the state-of-the-art EVES value predictor, aiming to efficiently configure the design parameters of the value predictor within constrained RAM resources. Additionally, the article evaluates the performance of the explored value predictor across a wide range of workloads. The explored value predictors exhibit high efficiency across RAM sizes ranging from 2KB to 16KB while maintaining acceptable computational complexity. Furthermore, the results indicate that the explored value predictor achieves optimal efficiency under the 2KB constraint, with the highest acceleration-to-cost ratio reaching 8.74% per KB, approximately three times greater than that of the current state-of-the-art value predictor.
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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