The Influence of Charged Conductive Atomic-Force Microscope Tip on Regimes of Electronic Transport in Diffusive Doped InAs Nanowire

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI:10.1134/S102745102470188X

A. A. Zhukov

引用次数: 0

Abstract

We performed investigations of impact of charged conductive atomic-force microscope (AFM) tip on magnetotransport in Si-doped InAs nanowire at helium temperatures. We demonstrate new type of influence of AFM tip, i.e. the tip does not reveal itself as an additional scattering center only, but it changes the dimension of fractal behavior of magneto-conductance dependencies of InAs nanowire.

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带电导电原子力显微镜针尖对扩散掺杂砷化镓纳米线电子传输机制的影响

我们研究了带电导电原子力显微镜（AFM）尖端在氦气温度下对硅掺杂 InAs 纳米线磁传导的影响。我们证明了原子力显微镜针尖的新型影响，即针尖不仅仅是一个额外的散射中心，它还改变了 InAs 纳米线磁导相关性的分形行为维度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.