Electric Arc Synthesis of Nonstoichiometric Tantalum Carbides with a Face-Centered Cubic Lattice

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
A. Ya. Pak, A. P. Korchagina, A. A. Svinukhova, T. Yu. Yakich, K. B. Larionov, Zh. S. Bolatova
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Abstract

In this paper, we report experimental results that show the feasibility of synthesizing ultrarefractory materials, namely crystalline phases of cubic tantalum carbide with a face-centered cubic lattice and different carbon-to-tantalum ratios. Experimental powder was synthesized using a low-voltage direct current arc discharge ignited in open air to heat up mixtures of different compositions (tantalum–carbon). The implementation of the nonvacuum electric arc method was carried out due to the self-shielding effect of the reaction zone of the arc reactor due to the sudden generation of CO and CO2 gases. The synthesis yielded tantalum carbides TaC0.77, TaC0.84, TaC0.92, and TaC1.00 with lattice parameters of 4.4194, 4.4322, 4.4448, and 4.4588 Å, respectively. The lattice parameters were determined by X-ray diffractometry. The morphological features of tantalum carbide powder particles obtained by vacuum-free electric arc synthesis were determined using scanning electron microscopy. The method of synchronous thermal analysis detected some differences in the oxidation processes of the resulting crystalline phases when heated in air. For the first time, cubic tantalum carbide phases with different stoichiometry were obtained in a series of experiments performed using vacuum-free arc synthesis.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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