Defect Formation and Displacement of Atoms on the Surface of a LiF Crystal under Bombardment with Low-Energy Cesium Ions

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI:10.1134/S1027451024702215

U. B. Sharopov, O. A. Abdulkhaev, B. E. Egamberdiev, K. A. Samiev, N. M. Nazarova, M. K. Kurbanov, M. K. Karimov, D. S. Saidov, Z. I. Iskandarov, S. Y. Islamov, A. R. Kakhramonov, O. E. Abdurakhmonov, I. A. Pronin, A. S. Komolov

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Abstract

Ion beam technology is an excellent tool for changing and investigating the structural and surface properties of crystals. In this paper, the possibility of modifying the surface of a thin LiF film under irradiation with low-energy Cs ions with an energy of 1 keV using the SRIM software method is investigated. The results of the study show that the average range of cesium ions is 51 Å, and the average surface binding energy is 2.8 eV. Due to the transfer and distribution of the energy of bombarding ions to the atomic lattice and as a result of the displacement of the lattice atoms from their initial positions, it is possible to obtain the value of displacement defects. The defect formation profile was investigated depending on DPA, which implies that the maximum peaks of defect displacement for LiF are at a crystal depth of 16 Å from the surface.

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.