Effects of Dynamic Diffraction in Coherent X-ray Radiation of Relativistic Electrons in a Periodic Layered Medium

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
A. V. Noskov, S. V. Blazhevich, A. V. Konovalenko
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Abstract

The work is devoted to the study of the possibility of manifestation of the effects of dynamic diffraction of coherent X-ray radiation of relativistic electrons in a periodic layered medium with three layers in a period. Coherent X-ray radiation is considered as a sum of parametric X-ray radiation and diffracted transition radiation. The dynamic theory of coherent X-ray relativistic electrons in the periodic layered medium with three layers in a period is developed. Within the framework of the two-wave approximation of the dynamic theory of diffraction, expressions in real form are obtained that describe the spectral-angular and angular density of radiation. The possibility of manifestation of the effects of dynamic diffraction of coherent X-ray radiation is investigated. The effect of asymmetry of the electron field reflection relative to the target surface on the spectral-angular densities of parametric X-ray and diffracted transition radiation is shown. The possibility of a bright manifestation of the effect of anomalous photoabsorption in parametric X-ray radiation in the considered three-layer structure is shown. This effect is analogous to the well-known Borrmann effect for X-rays in a single crystal.

Abstract Image

周期性层状介质中相对论电子相干x射线辐射的动态衍射效应
本文研究了在一个周期内具有三层的周期性层状介质中,相对论性电子相干x射线辐射的动态衍射效应表现的可能性。相干x射线辐射被认为是参数x射线辐射和衍射跃迁辐射的总和。建立了周期三层层状介质中相干x射线相对论电子的动力学理论。在衍射动力学理论的两波近似框架内,得到了描述辐射的谱角密度和角密度的实数表达式。探讨了相干x射线动态衍射效应表现的可能性。讨论了电子场反射相对于目标表面的不对称性对参数x射线和衍射跃迁辐射的谱角密度的影响。在考虑的三层结构中,显示了参数x射线辐射中异常光吸收效应的明亮表现的可能性。这种效应类似于单晶中x射线的著名的玻尔曼效应。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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