Effect of Annealing on the Defect Structure, Desorption Properties, and Structural-Phase State in Nanoscale Multilayer Zr/Nb Structures after Hydrogenation

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI:10.1134/S1027451024702136

A. D. Lomygin, D. G. Krotkevich, R. S. Laptev, Zh. Wang, A. A. Sidorin, O. S. Orlov

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Abstract

The effect of annealing after hydrogenation on the defect structure, desorption properties, and structural-phase state of nanoscale multilayer Zr/Nb systems has been studied. Nanoscale multilayer structures based on Zr/Nb were fabricated using a magnetron sputtering system with an individual layer thickness of 50 nm. To analyze changes in the defect structure, one of the techniques of positron annihilation spectroscopy was used, Doppler broadening spectroscopy with a positron beam of variable energy for layer-by-layer positron implantation in Zr/Nb. The depth distribution of elements before and after hydrogenation was studied using glow discharge optical emission spectrometry. Analysis of changes in the structural-phase state was carried out using X-ray diffraction analysis. Thermal desorption spectroscopy was used to study the desorption of hydrogen from Zr/Nb, and the activation energy of hydrogen release was calculated by constructing Arrhenius plots. The forms of the Arrhenius plots differ from their usual form, which is associated with a nontypical distribution of hydrogen in Zr/Nb.

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.