X-Ray Studies of Fe–NiCr Nanocomposites Produced in Underwater Low-Temperature Plasma

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
M. N. Shipko, A. V. Agafonov, M. A. Stepovich, A. V. Khlyustova, N. A. Sirotkin, A. A. Viryus
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Abstract

Fe–NiCr composites obtained in underwater low-temperature plasma excited between two metal electrodes Fe and NiCr in a volume of distilled water were studied using X-ray diffractometry and X-ray microanalysis. It was found that an increase in the discharge plasma current did not significantly affect the cathode sputtering rate but significantly affected the anode sputtering rate. The X-ray diffraction patterns of all synthesized samples contained reflections related to the layered structure. The synthesized products were not single-phase but were a mixture of iron, nickel, and chromium oxides. It was shown that low-temperature underwater plasma is an effective tool for the synthesis of nanocomposites based on metal oxides, the precursors of which are metal electrodes. The results obtained indicate the possibility of the formation of various modifications of iron oxides under underwater plasma conditions with partial replacement of iron ions by other ions with crystal-chemical properties close to those of iron, which can affect the electromagnetic properties of powder nanoparticles.

Abstract Image

水下低温等离子体制备Fe-NiCr纳米复合材料的x射线研究
用x射线衍射仪和x射线显微分析研究了在蒸馏水中Fe和NiCr两个金属电极之间激发的水下低温等离子体中制备的Fe - NiCr复合材料。结果表明,放电等离子体电流的增大对阴极溅射速率没有显著影响,但对阳极溅射速率有显著影响。所有合成样品的x射线衍射图都包含与层状结构有关的反射。合成的产物不是单相的,而是铁、镍和铬氧化物的混合物。研究结果表明,低温水下等离子体是制备以金属电极为前驱体的金属氧化物纳米复合材料的有效工具。研究结果表明,在水下等离子体条件下,铁离子部分被晶体化学性质接近铁的其他离子取代,形成各种铁氧化物修饰的可能性,从而影响粉末纳米颗粒的电磁性能。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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