Tian Yu;Yingqi Ma;Xiaoheng Xu;Xiang Zhu;Longlong Zhang;Jieyi Wang;Jianwei Han
{"title":"Investigation on Radiation Effects of White Neutron Source on COTS Solid-State Drives","authors":"Tian Yu;Yingqi Ma;Xiaoheng Xu;Xiang Zhu;Longlong Zhang;Jieyi Wang;Jianwei Han","doi":"10.1109/TNS.2025.3535502","DOIUrl":null,"url":null,"abstract":"Commercial solid-state drives (SSDs) were subjected to broad-spectrum neutron exposure at the China Spallation Neutron Source (CSNS) to analyze radiation-induced errors in components and functional interruptions in non-volatile memory express (NVMe) and serial advanced technology attachment (SATA) SSDs. The experiments revealed apparent sensitivity differences, with NVMe SSDs demonstrating better resistance at the module level due to advanced controller technology and enhanced error correction capabilities than SATA SSDs. For NVMe SSDs, functional interruptions were primarily identified as <sc>nand</small> Flash faults, such as timeouts, and dynamic random access memory (DRAM) errors, such as stuck bits, while controller vulnerabilities contributed minimally. Moreover, this article examines the dominance of read errors as the primary failure mode in <sc>nand</small> Flash and explores how the cumulative characteristic of these errors correlates with functional interruptions.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"875-883"},"PeriodicalIF":1.9000,"publicationDate":"2025-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Nuclear Science","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10855552/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Commercial solid-state drives (SSDs) were subjected to broad-spectrum neutron exposure at the China Spallation Neutron Source (CSNS) to analyze radiation-induced errors in components and functional interruptions in non-volatile memory express (NVMe) and serial advanced technology attachment (SATA) SSDs. The experiments revealed apparent sensitivity differences, with NVMe SSDs demonstrating better resistance at the module level due to advanced controller technology and enhanced error correction capabilities than SATA SSDs. For NVMe SSDs, functional interruptions were primarily identified as nand Flash faults, such as timeouts, and dynamic random access memory (DRAM) errors, such as stuck bits, while controller vulnerabilities contributed minimally. Moreover, this article examines the dominance of read errors as the primary failure mode in nand Flash and explores how the cumulative characteristic of these errors correlates with functional interruptions.
期刊介绍:
The IEEE Transactions on Nuclear Science is a publication of the IEEE Nuclear and Plasma Sciences Society. It is viewed as the primary source of technical information in many of the areas it covers. As judged by JCR impact factor, TNS consistently ranks in the top five journals in the category of Nuclear Science & Technology. It has one of the higher immediacy indices, indicating that the information it publishes is viewed as timely, and has a relatively long citation half-life, indicating that the published information also is viewed as valuable for a number of years.
The IEEE Transactions on Nuclear Science is published bimonthly. Its scope includes all aspects of the theory and application of nuclear science and engineering. It focuses on instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.