Measurement of uranium content in resin within adsorption towers in the in-situ leaching uranium process by total reflection X-ray fluorescence (TXRF)

IF 3.8 2区化学 Q1 SPECTROSCOPY

Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2025-03-06 DOI:10.1016/j.sab.2025.107169

Xingyu Wang , Siyu Liao , Daqian Hei , Jiatong Li , Lian Chen , Pingkun Cai , Can Cheng

引用次数: 0

Abstract

Monitoring uranium content in the resin within adsorption columns is critical in the in-situ leaching (ISL) uranium extraction process, as it indicates when the resin requires replacement. This study employs total reflection X-ray fluorescence (TXRF) analysis with typical ISL leaching solutions to prepare samples for quantitative uranium analysis in resin. The study evaluates how leaching solution concentration, type, and volume affect detection efficiency. Assesses leaching solution elution efficiency by analyzing the suspension obtained after grinding the resin. Quantitative analysis results closely align with those from the laboratory pulse neutron method. TXRF enables rapid sample preparation and testing, making it ideal for quantitative uranium analysis in resin within adsorption columns during dynamic operation.

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全反射x射线荧光（TXRF）测定原位浸铀过程中吸附塔内树脂中的铀含量

监测吸附柱内树脂中的铀含量在原位浸出（ISL）铀萃取过程中是至关重要的，因为它表明树脂何时需要更换。本研究采用全反射x射线荧光（TXRF）分析，采用典型的ISL浸出溶液制备树脂中铀的定量分析样品。研究评价了浸出液浓度、类型和体积对检测效率的影响。通过分析研磨树脂后得到的悬浮液来评价浸出液的洗脱效率。定量分析结果与实验室脉冲中子法基本一致。TXRF能够快速制备和测试样品，使其成为动态操作期间吸附柱内树脂定量铀分析的理想选择。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Spectrochimica Acta Part B: Atomic Spectroscopy 物理-光谱学

CiteScore

6.10

自引率

12.10%

发文量

173

审稿时长

81 days

期刊介绍： Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.