Xingyu Wang , Siyu Liao , Daqian Hei , Jiatong Li , Lian Chen , Pingkun Cai , Can Cheng
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引用次数: 0
Abstract
Monitoring uranium content in the resin within adsorption columns is critical in the in-situ leaching (ISL) uranium extraction process, as it indicates when the resin requires replacement. This study employs total reflection X-ray fluorescence (TXRF) analysis with typical ISL leaching solutions to prepare samples for quantitative uranium analysis in resin. The study evaluates how leaching solution concentration, type, and volume affect detection efficiency. Assesses leaching solution elution efficiency by analyzing the suspension obtained after grinding the resin. Quantitative analysis results closely align with those from the laboratory pulse neutron method. TXRF enables rapid sample preparation and testing, making it ideal for quantitative uranium analysis in resin within adsorption columns during dynamic operation.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.