Development of inductively coupled plasma tandem mass spectrometric method for the determination of cadmium in tumorous stem mustard (Brassica juncea var. tumida Tsen et Lee) using N2O as reaction gas

IF 3.2 2区化学 Q1 SPECTROSCOPY

Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2025-03-06 DOI:10.1016/j.sab.2025.107170

Bo Jiang , Lin Chen , Zi-yang Yi , Bo-ping Hui , Qing-xia Lin , Zhen-peng Bin , Li-na Lin , Run-li Che , Chun-mei Nie , Jianhua Huang

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Abstract

This work proposed a novel method to determine trace levels of Cd in tumorous stem mustard (TSM) using inductively coupled plasma tandem mass spectrometry (ICP-MS/MS). In the MS/MS mode, N₂O was used as a reaction gas to eliminate spectral interference and optimize the analysis conditions. The accuracy and precision of the proposed method were evaluated by analysis of spinach leaves (SRM 1570a) as standard reference material and by comparing the obtained results with those achieved using sector field ICP-MS (SF-ICP-MS). The limit of detection (LOD) of Cd was in the range of 0.83–5.64 ng L⁻¹, and the LOD of ¹¹⁴Cd with the highest sensitivity was as low as 1.28 ng L⁻¹. At a 95 % confidence level, no significant differences were found between the results obtained via this method and SF-ICP-MS (p > 0.05), with relative standard deviation (RSD) of 1.4 %–2.5 %. The experimental results indicate that the developed method exhibits high sensitivity, accuracy, and reliability, making it suitable for interference-free detection of trace Cd in TSM.

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来源期刊

Spectrochimica Acta Part B: Atomic Spectroscopy 物理-光谱学

CiteScore

6.10

自引率

12.10%

发文量

173

审稿时长

81 days

期刊介绍： Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.