{"title":"Unveiling the Dynamics of Frenkel Defects in Fluoride Materials for X-Ray-Induced Persistent Luminescence and Advanced Imaging Applications","authors":"Mingxing Li, Wenwu You, Shuanglai Liu, Jiacai Li, Huafang Zhang, Gencai Pan, Yanli Mao","doi":"10.1002/lpor.202500092","DOIUrl":null,"url":null,"abstract":"The persistent luminescence (PersL) induced by X-rays in fluoride materials has garnered widespread application within the field of optoelectronics. However, the complexity of the trap systems in multi-component fluoride materials has impeded further exploration into PersL properties. Here, a compound consisting solely of fluoride and lanthanide ions is focused on, which simplifies the revelation of the PersL mechanism under X-ray excitation. Experimental and theoretical results reveal that the PersL phenomenon is primarily attributed to the migration and recovery processes of interstitial fluoride ions within the lattice. Depending on the localization of the interstitial fluoride ions, the corresponding Frenkel defects can be classified into two distinct types: those that are readily self-recoverable near the matrix lanthanide ions and those that are less likely to self-recover near the dopant ions. The anomalous PersL phenomena observed at temperatures that do not correspond to the thermoluminescence spectra further substantiate the existence of these dynamic traps. Furthermore, leveraging the material's superior PersL properties, a scintillator film is prepared and utilized for X-ray PersL imaging in static displays. These findings provide a refined understanding of the PersL mechanism related to Frenkel defects, laying a solid foundation for the continued application and development of PersL technology.","PeriodicalId":204,"journal":{"name":"Laser & Photonics Reviews","volume":"54 1","pages":""},"PeriodicalIF":9.8000,"publicationDate":"2025-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Laser & Photonics Reviews","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1002/lpor.202500092","RegionNum":1,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
Abstract
The persistent luminescence (PersL) induced by X-rays in fluoride materials has garnered widespread application within the field of optoelectronics. However, the complexity of the trap systems in multi-component fluoride materials has impeded further exploration into PersL properties. Here, a compound consisting solely of fluoride and lanthanide ions is focused on, which simplifies the revelation of the PersL mechanism under X-ray excitation. Experimental and theoretical results reveal that the PersL phenomenon is primarily attributed to the migration and recovery processes of interstitial fluoride ions within the lattice. Depending on the localization of the interstitial fluoride ions, the corresponding Frenkel defects can be classified into two distinct types: those that are readily self-recoverable near the matrix lanthanide ions and those that are less likely to self-recover near the dopant ions. The anomalous PersL phenomena observed at temperatures that do not correspond to the thermoluminescence spectra further substantiate the existence of these dynamic traps. Furthermore, leveraging the material's superior PersL properties, a scintillator film is prepared and utilized for X-ray PersL imaging in static displays. These findings provide a refined understanding of the PersL mechanism related to Frenkel defects, laying a solid foundation for the continued application and development of PersL technology.
期刊介绍:
Laser & Photonics Reviews is a reputable journal that publishes high-quality Reviews, original Research Articles, and Perspectives in the field of photonics and optics. It covers both theoretical and experimental aspects, including recent groundbreaking research, specific advancements, and innovative applications.
As evidence of its impact and recognition, Laser & Photonics Reviews boasts a remarkable 2022 Impact Factor of 11.0, according to the Journal Citation Reports from Clarivate Analytics (2023). Moreover, it holds impressive rankings in the InCites Journal Citation Reports: in 2021, it was ranked 6th out of 101 in the field of Optics, 15th out of 161 in Applied Physics, and 12th out of 69 in Condensed Matter Physics.
The journal uses the ISSN numbers 1863-8880 for print and 1863-8899 for online publications.