Enhancing MEMS scanning mirror projection displays through phase-shifted Lissajous trajectory optimization

IF 4.1 3区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

Sensors and Actuators A-physical Pub Date : 2025-03-11 DOI:10.1016/j.sna.2025.116447

Shaotang Wei , Jinwu Song , Junya Wang , Zheng You

引用次数: 0

Abstract

Biaxial resonant MEMS scanning mirrors, characterized by high operational frequencies and wide scanning angles, hold significant potential for advanced projection display systems. Nevertheless, conventional Lissajous scanning with fixed parameters often suffers from non-uniform pixel coverage and resolution inconsistencies. This study presents a novel phase-shift-based Lissajous trajectory optimization method, wherein the initial phase is dynamically adjusted for each scanning frame. The proposed approach markedly improves trajectory coverage uniformity and mitigates pixelation artifacts, including pixel defects and the screen-door effect. Theoretical analysis and numerical simulations validate the enhanced spatial coverage achieved by the phase-shifting strategy compared to traditional fixed-parameter scanning. Furthermore, experimental results substantiate the method’s efficacy in delivering high- quality projection displays, even at low frame rates.

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来源期刊

Sensors and Actuators A-physical 工程技术-工程：电子与电气

CiteScore

8.10

自引率

6.50%

发文量

630

审稿时长

49 days

期刊介绍： Sensors and Actuators A: Physical brings together multidisciplinary interests in one journal entirely devoted to disseminating information on all aspects of research and development of solid-state devices for transducing physical signals. Sensors and Actuators A: Physical regularly publishes original papers, letters to the Editors and from time to time invited review articles within the following device areas: • Fundamentals and Physics, such as: classification of effects, physical effects, measurement theory, modelling of sensors, measurement standards, measurement errors, units and constants, time and frequency measurement. Modeling papers should bring new modeling techniques to the field and be supported by experimental results. • Materials and their Processing, such as: piezoelectric materials, polymers, metal oxides, III-V and II-VI semiconductors, thick and thin films, optical glass fibres, amorphous, polycrystalline and monocrystalline silicon. • Optoelectronic sensors, such as: photovoltaic diodes, photoconductors, photodiodes, phototransistors, positron-sensitive photodetectors, optoisolators, photodiode arrays, charge-coupled devices, light-emitting diodes, injection lasers and liquid-crystal displays. • Mechanical sensors, such as: metallic, thin-film and semiconductor strain gauges, diffused silicon pressure sensors, silicon accelerometers, solid-state displacement transducers, piezo junction devices, piezoelectric field-effect transducers (PiFETs), tunnel-diode strain sensors, surface acoustic wave devices, silicon micromechanical switches, solid-state flow meters and electronic flow controllers. Etc...