Structured-Defect Engineering of Hexagonal Boron Nitride for Identified Visible Single-Photon Emitters

IF 16 1区 材料科学 Q1 CHEMISTRY, MULTIDISCIPLINARY
Tsz Wing Tang, Ritika Ritika, Mohsen Tamtaji, Hongwei Liu, Yunxia Hu, Zhenjing Liu, Patrick Ryan Galligan, Mengyang Xu, Jinghan Shen, Jun Wang, Jiawen You, Yuyin Li, GuanHua Chen*, Igor Aharonovich* and Zhengtang Luo*, 
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引用次数: 0

Abstract

Visible-range single-photon emitters (SPEs), based on hexagonal boron nitride (hBN), with exceptional optical performance have become an outstanding candidate for quantum optical technology. However, the control of the carbon defect structures to obtain uniform and confined band structure remains elusive, restricting their integration into on-chip quantum devices. Here, we demonstrate tuning of the defect structure of hBN to precisely control the emission in SPEs. The defect structure engineering from CB (carbon substituted at the boron site) to C2B–CN (carbon doped into two boron sites and one nitrogen site) carbon defect conversion in hBN is realized by regulating the carbon concentration from 0.0005 at % to 0.082 at % in Cu substrates to adjust the carbon diffusion during the CVD process. Meanwhile, the zero-phonon line exhibits a precise shift from the range of 600–610 nm to 630–640 nm; these shifts of the spectral features are further supported by density functional theory results, reflected in changes in the band structure, vibrational degrees of freedom, and electronic transitions. The SPE emission spectrum serves as a valuable tool for identifying the footprint of a carbon point defect structure change. Our project offers evidence of achieving structured defect engineering for tailored emission properties and showcases potential for the integration of advanced 2D material engineering into on-chip quantum devices.

六方氮化硼可见单光子发射体的结构缺陷工程
基于六方氮化硼(hBN)的可见范围单光子发射器(spe)具有优异的光学性能,已成为量子光学技术的杰出候选者。然而,控制碳缺陷结构以获得均匀和受限的能带结构仍然是难以捉摸的,这限制了它们集成到片上量子器件中。在这里,我们演示了调整hBN的缺陷结构以精确控制spe中的发射。通过调节Cu衬底中碳浓度从0.0005 at %到0.082 at %,调节CVD过程中碳的扩散,实现了hBN中从CB(硼位碳取代)到C2B-CN(碳掺杂到两个硼位和一个氮位)碳缺陷转化的缺陷结构工程。同时,零声子线在600 ~ 610 nm到630 ~ 640 nm之间有精确的位移;这些光谱特征的变化进一步得到了密度泛函理论结果的支持,反映在能带结构、振动自由度和电子跃迁的变化上。SPE发射光谱是识别碳点缺陷结构变化足迹的重要工具。我们的项目为实现定制发射特性的结构化缺陷工程提供了证据,并展示了将先进的2D材料工程集成到片上量子器件中的潜力。
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来源期刊
ACS Nano
ACS Nano 工程技术-材料科学:综合
CiteScore
26.00
自引率
4.10%
发文量
1627
审稿时长
1.7 months
期刊介绍: ACS Nano, published monthly, serves as an international forum for comprehensive articles on nanoscience and nanotechnology research at the intersections of chemistry, biology, materials science, physics, and engineering. The journal fosters communication among scientists in these communities, facilitating collaboration, new research opportunities, and advancements through discoveries. ACS Nano covers synthesis, assembly, characterization, theory, and simulation of nanostructures, nanobiotechnology, nanofabrication, methods and tools for nanoscience and nanotechnology, and self- and directed-assembly. Alongside original research articles, it offers thorough reviews, perspectives on cutting-edge research, and discussions envisioning the future of nanoscience and nanotechnology.
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