A Semi-Supervised Enhanced Fault Diagnosis Algorithm for Complex Equipment Assisted by Digital Multitwins

IF 5.6 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Sizhe Liu;Dezhi Xu;Chao Shen;Yujian Ye;Bin Jiang
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引用次数: 0

Abstract

The accuracy of fault diagnosis technology is crucial for the reliable operation of complex machinery. However, traditional diagnostic methods often rely on large amounts of labeled data, making it difficult to address the challenge of scarce labeled data in real industrial environments. To tackle this issue, this article proposes a three-stage semi-supervised fault diagnosis method that combines digital multitwins and lightweight multiscale attention (MSA) mechanisms. By leveraging digital multitwins technology, we build a triplex pump mechanism simulation model in Simscape to obtain operational data for various typical fault modes. Additionally, a deep data twin (DDT) approach is employed for self-supervised data augmentation, effectively expanding the sample space and enhancing the model’s generalization capabilities. Furthermore, we design a lightweight multiscale attention network (LMAN), which utilizes multiscale convolution and channel attention mechanisms to enhance the extraction of fault features, thereby improving diagnostic accuracy. Under the framework of a three-stage semi-supervised strategy, labeled and unlabeled data are gradually integrated to boost the accuracy of the fault diagnosis model. Experimental results demonstrate that this method exhibits excellent classification capability across different labeling ratios, achieving a significant performance improvement, particularly in scenarios with limited labeled data. This study provides an efficient semi-supervised learning solution for fault diagnosis of complex machinery, offering strong potential for industrial applications.
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来源期刊
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement 工程技术-工程:电子与电气
CiteScore
9.00
自引率
23.20%
发文量
1294
审稿时长
3.9 months
期刊介绍: Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
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