{"title":"Study on Loss mechanisms in SAW Resonators Using 42-LT Thin Plate by Full-3D FEM with Hierarchical Cascading Technique.","authors":"Yiming Liu, Yiwen He, Zijiang Yang, Fangyi Li, Jingfu Bao, Ken-Ya Hashimoto","doi":"10.1109/TUFFC.2025.3543541","DOIUrl":null,"url":null,"abstract":"<p><p>This paper describes study of loss mechanisms in an incredible high performance surface acoustic wave (I.H.P. SAW) resonator on the 42°YX-LiTaO<sub>3</sub>/SiO<sub>2</sub>/Si structure. The full three-dimensional (3D) finite element method (FEM) is applied with the assistance of the hierarchical cascading technique. Excellent agreement is obtained between calculation and measurement not only for the effective electromechanical coupling factor k<sub>eff</sub><sup>2</sup> but also the Bode Q without inclusion of empirical loss mechanisms. Behavior of calculated Bode Q is mostly governed by the number of IDT finger pairs N<sub>I</sub> and aperture length W. SAW field distribution is derived from the FEM result. Oblique SAW leakage is observed in the busbar region of reflectors and becomes negligible when N<sub>I</sub> is large. From this, it is concluded that the Bode Q reduction discussed here is mainly occurred by the oblique SAW leakage caused by the in-plane diffraction. Finally, the mBVD model is applied for quantitative characterization. It is shown that the in-plane SAW diffraction can be modelled well by the mBVD model and gives significant impact only to the anti-resonance Q. Surprisingly its loss is dominant even when N<sub>I</sub>=100.</p>","PeriodicalId":13322,"journal":{"name":"IEEE transactions on ultrasonics, ferroelectrics, and frequency control","volume":"PP ","pages":""},"PeriodicalIF":3.0000,"publicationDate":"2025-02-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE transactions on ultrasonics, ferroelectrics, and frequency control","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/TUFFC.2025.3543541","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ACOUSTICS","Score":null,"Total":0}
引用次数: 0
Abstract
This paper describes study of loss mechanisms in an incredible high performance surface acoustic wave (I.H.P. SAW) resonator on the 42°YX-LiTaO3/SiO2/Si structure. The full three-dimensional (3D) finite element method (FEM) is applied with the assistance of the hierarchical cascading technique. Excellent agreement is obtained between calculation and measurement not only for the effective electromechanical coupling factor keff2 but also the Bode Q without inclusion of empirical loss mechanisms. Behavior of calculated Bode Q is mostly governed by the number of IDT finger pairs NI and aperture length W. SAW field distribution is derived from the FEM result. Oblique SAW leakage is observed in the busbar region of reflectors and becomes negligible when NI is large. From this, it is concluded that the Bode Q reduction discussed here is mainly occurred by the oblique SAW leakage caused by the in-plane diffraction. Finally, the mBVD model is applied for quantitative characterization. It is shown that the in-plane SAW diffraction can be modelled well by the mBVD model and gives significant impact only to the anti-resonance Q. Surprisingly its loss is dominant even when NI=100.
期刊介绍:
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control includes the theory, technology, materials, and applications relating to: (1) the generation, transmission, and detection of ultrasonic waves and related phenomena; (2) medical ultrasound, including hyperthermia, bioeffects, tissue characterization and imaging; (3) ferroelectric, piezoelectric, and piezomagnetic materials, including crystals, polycrystalline solids, films, polymers, and composites; (4) frequency control, timing and time distribution, including crystal oscillators and other means of classical frequency control, and atomic, molecular and laser frequency control standards. Areas of interest range from fundamental studies to the design and/or applications of devices and systems.