A lab-based micro-X-ray fluorescence spectrometer with high photon flux and spatial resolution for ancient ceramic research†

IF 3.1 2区化学 Q2 CHEMISTRY, ANALYTICAL

Journal of Analytical Atomic Spectrometry Pub Date : 2025-01-18 DOI:10.1039/D4JA00319E

Xiao-Sheng Lin, Miao-Miao Wang, Miao Shu, Chao-Yang Li, Hai-Jing Li, Xu Wang, Chun-Zhen Yang and Rui Si

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Abstract

A new compact, extendable and lab-based micro-XRF (μXRF) spectrometer with high photon flux and spatial resolution is developed and reported in this paper. With a liquid Ga–In alloy jet as the X-ray source and using a multi-layer focusing mirror, the spectrometer provides an energy of 9.25 keV, with a focused spot size of 70 μm (H) × 63 μm (V) and a photon flux density of about 4.15 × 10¹¹ photons per s per mm². A National Institute of Standards and Technology (NIST) standard reference material (SRM) 611 was used to determine the detection limits (DLs). The spectrometer provides the DLs of 5.7–86.5 ppm in the atomic number range of 20–29. Finally, an ancient turquoise glazed ceramic was investigated by this method. The μXRF mapping results can help to reveal elemental compositions and could be used to facilitate an in-depth investigation of the production of ceramics when combined with graphical displays. This in situ μXRF analysis in the laboratory could serve as an effective means for understanding the microstructure of samples.

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用于古代陶瓷研究的高光子通量和空间分辨率的实验室微x射线荧光光谱仪

研制了一种小型、可扩展、高光子通量、高空间分辨率的实验室微型xrf光谱仪。该光谱仪以液态Ga-In合金射流为x射线源，采用多层聚焦镜，提供9.25 keV的能量，聚焦光斑尺寸为70 μm (H) × 63 μm (V)，光子通量密度约为4.15 × 1011光子/ s / mm2。采用美国国家标准与技术研究所（NIST）标准参考物质（SRM） 611测定检测限（dl）。该光谱仪在20-29原子序数范围内提供5.7-86.5 ppm的dl。最后，用该方法对一种古绿松石釉面陶瓷进行了研究。μXRF测图结果有助于揭示元素组成，并可与图形显示相结合，用于促进对陶瓷生产的深入研究。实验室内的原位μXRF分析可作为了解样品微观结构的有效手段。

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