Frequency-Assisted Contrastive Learning With Cyclic Fine-Tuning for Rotating Machinery Fault Diagnosis Under Limited Labeled Data

IF 5.6 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Xinyu Li;Changming Cheng;Zhike Peng
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引用次数: 0

Abstract

The scarcity of labeled data severely limits the performance of traditional supervised learning-based intelligent methods for rotating machinery fault diagnosis. Recently, contrastive learning (CL) has been successfully applied to rotating machinery fault diagnosis due to its capability to learn data representations without the need for labeling information. Nevertheless, existing CL-based diagnostic methods primarily suffer from two drawbacks. First, most methods merely depend on time-domain views of signals while neglecting the significance of the frequency domain, leading to weakly discriminative representations. Second, the conventional fine-tuning strategy only relies on labeled data while discarding the unlabeled one, impairing model generalization. To tackle these drawbacks, this article proposes a novel diagnostic method based on frequency-assisted CL (FACL) and cyclic fine-tuning (CFT). In the pretraining stage, FACL utilizes the time-frequency relational contrastive loss to correlate the time view with the frequency view, allowing the frequency-view data to effectively assist the time-view contrastive learning, thus yielding representations with enhanced discriminability. In the fine-tuning stage, CFT enables both labeled and unlabeled data to contribute to model fine-tuning through pseudo labeling, enhancing model generalization. Additionally, a weighted pseudo-labeling (WPL) strategy is devised to alleviate the defect of noisy labels. Comparative and ablation experiments are conducted on two public and one self-organized datasets. The superiority of the proposed method in diagnosing faults for rotating machinery with limited labeled data is evidenced by a 39.77% accuracy improvement over supervised learning and a 28.61% improvement over other CL-based methods.
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来源期刊
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement 工程技术-工程:电子与电气
CiteScore
9.00
自引率
23.20%
发文量
1294
审稿时长
3.9 months
期刊介绍: Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
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