Analytic Synthesis of Focused Fields of Low Sidelobe Levels Inside Metallic Cavity by 3-D Eigenmodes Mapping

IF 3.7 2区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Xin Ma;Chongyao Ning;Deshuang Zhao;Bing-Zhong Wang
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引用次数: 0

Abstract

Flexibly generating the desired focused electric fields within a target area inside a metallic cavity is a challenging problem relevant in many applications. This letter proposes an analytical method for synthesizing the focused fields based on the eigenmode mapping (EMM) from 2-D to 3-D. Initially, the desired focused fields within the target area are expressed by the superposition of 2-D eigenmodes. These 2-D eigenmodes are then mapped onto 3-D eigenmodes, which can be excited at the same frequency. Subsequently, the antenna array excites the synthesized field, with the excitation coefficients determined by the excitation matrix and the 3-D eigenmode expansion vector of the desired electric field. Owing to its analytical properties, this method rapidly calculates the excitation coefficients, enabling real-time control of the focused field generation inside the cavity. Furthermore, the proposed method not only prevents the excitation of a limited number of 3-D eigenmodes and unwanted higher-order 3-D eigenmodes, but also takes into account the field distribution outside the focal spots, effectively reducing sidelobe levels. Full-wave simulations demonstrate that the proposed method successfully generated two focused fields with sidelobe levels 6 dB lower than the traditional time reversal (TR) method.
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来源期刊
CiteScore
8.00
自引率
9.50%
发文量
529
审稿时长
1.0 months
期刊介绍: IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.
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