Structural, defect, and photoelectric characterization of CdTe-based single crystals grown by a vertical Bridgman method

IF 4.8 2区材料科学 Q1 MATERIALS SCIENCE, CHARACTERIZATION & TESTING

Materials Characterization Pub Date : 2025-03-01 DOI:10.1016/j.matchar.2025.114899

Boyang Wang , Pengfei Yu , Yuting Li , Qingyang Xu , Yize Zhang , Wanqi Jie

{"title":"Structural, defect, and photoelectric characterization of CdTe-based single crystals grown by a vertical Bridgman method","authors":"Boyang Wang , Pengfei Yu , Yuting Li , Qingyang Xu , Yize Zhang , Wanqi Jie","doi":"10.1016/j.matchar.2025.114899","DOIUrl":null,"url":null,"abstract":"<div><div>This study presents a comparative characterization of CdZnTe, CdMnTe, and CdMgTe single crystals, grown via a modified vertical Bridgman method, focusing on their structural, defect, optical, and electrical properties for room-temperature radiation detection applications. XRD analysis confirmed the sphalerite structure of all three crystals, with distinct preferred orientations influenced by spontaneous nucleation. CdMgTe crystal featured a lower density of Te inclusions (approximately 10<sup>3</sup> cm<sup>−2</sup>) compared to CdZnTe and CdMnTe. TEM analysis revealed all three crystals contained nanoscale Te precipitates, contributing to lattice distortion and dislocations. Compared to CdZnTe crystal, CdMnTe and CdMgTe exhibit better compositional uniformity. CdZnTe demonstrated superior crystal quality, with an average infrared transmittance of 62 % and a distinct free exciton peak in the photoluminescence spectrum. The resistivity of all three crystals met the specifications for room-temperature radiation detectors, with CdZnTe, exhibiting a resistivity of up to 7.09 × 10<sup>10</sup> Ω·cm, showing the best detector performance.</div></div>","PeriodicalId":18727,"journal":{"name":"Materials Characterization","volume":"223 ","pages":"Article 114899"},"PeriodicalIF":4.8000,"publicationDate":"2025-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Characterization","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1044580325001883","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, CHARACTERIZATION & TESTING","Score":null,"Total":0}

引用次数: 0

Abstract

This study presents a comparative characterization of CdZnTe, CdMnTe, and CdMgTe single crystals, grown via a modified vertical Bridgman method, focusing on their structural, defect, optical, and electrical properties for room-temperature radiation detection applications. XRD analysis confirmed the sphalerite structure of all three crystals, with distinct preferred orientations influenced by spontaneous nucleation. CdMgTe crystal featured a lower density of Te inclusions (approximately 10³ cm⁻²) compared to CdZnTe and CdMnTe. TEM analysis revealed all three crystals contained nanoscale Te precipitates, contributing to lattice distortion and dislocations. Compared to CdZnTe crystal, CdMnTe and CdMgTe exhibit better compositional uniformity. CdZnTe demonstrated superior crystal quality, with an average infrared transmittance of 62 % and a distinct free exciton peak in the photoluminescence spectrum. The resistivity of all three crystals met the specifications for room-temperature radiation detectors, with CdZnTe, exhibiting a resistivity of up to 7.09 × 10¹⁰ Ω·cm, showing the best detector performance.

查看原文本刊更多论文

求助全文

约1分钟内获得全文求助全文

来源期刊

Materials Characterization 工程技术-材料科学：表征与测试

CiteScore

7.60

自引率

8.50%

发文量

746

审稿时长

36 days

期刊介绍： Materials Characterization features original articles and state-of-the-art reviews on theoretical and practical aspects of the structure and behaviour of materials. The Journal focuses on all characterization techniques, including all forms of microscopy (light, electron, acoustic, etc.,) and analysis (especially microanalysis and surface analytical techniques). Developments in both this wide range of techniques and their application to the quantification of the microstructure of materials are essential facets of the Journal. The Journal provides the Materials Scientist/Engineer with up-to-date information on many types of materials with an underlying theme of explaining the behavior of materials using novel approaches. Materials covered by the journal include: Metals & Alloys Ceramics Nanomaterials Biomedical materials Optical materials Composites Natural Materials.