Silicon carbide MOSFETs: A critical review of applications, technological advancements, and future perspectives

IF 2.7 Q2 PHYSICS, CONDENSED MATTER
P. Sharmila , G. Supraja , D. Haripriya , C. Sivamani , A. Lakshmi Narayana
{"title":"Silicon carbide MOSFETs: A critical review of applications, technological advancements, and future perspectives","authors":"P. Sharmila ,&nbsp;G. Supraja ,&nbsp;D. Haripriya ,&nbsp;C. Sivamani ,&nbsp;A. Lakshmi Narayana","doi":"10.1016/j.micrna.2025.208126","DOIUrl":null,"url":null,"abstract":"<div><div>The emergence of Silicon Carbide (SiC) power MOSFETs represents a revolutionary advancement in power semiconductor technology, fundamentally transforming the landscape of modern power electronics. This comprehensive review systematically analyzes the technological evolution, current state-of-the-art developments, and future trajectories of SiC MOSFET technology, encompassing device physics, structural innovations, manufacturing processes, and application-specific optimizations. Our analysis encompasses a detailed examination of device architectures, progressing from conventional planar structures through advanced trench designs to innovative hybrid configurations, elucidating their respective advantages, limitations, and specific design considerations. The review provides extensive coverage of manufacturing processes, reliability considerations, and optimization strategies that have enabled the achievement of remarkable performance benchmarks, including specific on-resistance values as low as 1.8 mΩ cm<sup>2</sup> at 1200V ratings. Special attention is devoted to electric vehicle applications, where SiC MOSFETs have demonstrated transformative capabilities through significantly improved system efficiency (&gt;98 %), enhanced switching frequencies (&gt;50 kHz), and superior thermal performance (up to 175 °C). This comprehensive analysis culminates in a detailed assessment of future prospects, examining potential technological trajectories, market dynamics, and emerging application domains. The review serves as a valuable resource for researchers, engineers, and practitioners in power electronics, providing both fundamental understanding and practical insights into the implementation of SiC MOSFET technology across diverse applications.</div></div>","PeriodicalId":100923,"journal":{"name":"Micro and Nanostructures","volume":"202 ","pages":"Article 208126"},"PeriodicalIF":2.7000,"publicationDate":"2025-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micro and Nanostructures","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S277301232500055X","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0

Abstract

The emergence of Silicon Carbide (SiC) power MOSFETs represents a revolutionary advancement in power semiconductor technology, fundamentally transforming the landscape of modern power electronics. This comprehensive review systematically analyzes the technological evolution, current state-of-the-art developments, and future trajectories of SiC MOSFET technology, encompassing device physics, structural innovations, manufacturing processes, and application-specific optimizations. Our analysis encompasses a detailed examination of device architectures, progressing from conventional planar structures through advanced trench designs to innovative hybrid configurations, elucidating their respective advantages, limitations, and specific design considerations. The review provides extensive coverage of manufacturing processes, reliability considerations, and optimization strategies that have enabled the achievement of remarkable performance benchmarks, including specific on-resistance values as low as 1.8 mΩ cm2 at 1200V ratings. Special attention is devoted to electric vehicle applications, where SiC MOSFETs have demonstrated transformative capabilities through significantly improved system efficiency (>98 %), enhanced switching frequencies (>50 kHz), and superior thermal performance (up to 175 °C). This comprehensive analysis culminates in a detailed assessment of future prospects, examining potential technological trajectories, market dynamics, and emerging application domains. The review serves as a valuable resource for researchers, engineers, and practitioners in power electronics, providing both fundamental understanding and practical insights into the implementation of SiC MOSFET technology across diverse applications.
碳化硅mosfet:应用,技术进步和未来前景的关键审查
碳化硅(SiC)功率mosfet的出现代表了功率半导体技术的革命性进步,从根本上改变了现代电力电子的格局。本综述系统地分析了SiC MOSFET技术的技术演变、最新发展和未来发展轨迹,包括器件物理、结构创新、制造工艺和特定应用的优化。我们的分析包括对器件架构的详细检查,从传统的平面结构到先进的沟槽设计再到创新的混合配置,阐明了各自的优势、局限性和具体的设计考虑。该综述提供了广泛的制造工艺、可靠性考虑因素和优化策略,使其能够实现卓越的性能基准,包括在1200V额定值下低至1.8 mΩ cm2的特定导通电阻值。特别关注电动汽车应用,其中SiC mosfet通过显着提高系统效率(> 98%),增强开关频率(>50 kHz)和卓越的热性能(高达175°C)展示了变革性能力。这份全面的分析以对未来前景的详细评估为高潮,考察了潜在的技术轨迹、市场动态和新兴应用领域。该综述为电力电子领域的研究人员、工程师和从业人员提供了宝贵的资源,为在各种应用中实现SiC MOSFET技术提供了基本的理解和实际的见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
6.50
自引率
0.00%
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