Spatiotemporal visualisation of electrocatalyst/electrolyte interfaces with electrochemical atomic force microscopy: Applications and notes.

IF 1.9 4区 工程技术 Q3 MICROSCOPY
Weiran Zheng
{"title":"Spatiotemporal visualisation of electrocatalyst/electrolyte interfaces with electrochemical atomic force microscopy: Applications and notes.","authors":"Weiran Zheng","doi":"10.1111/jmi.13401","DOIUrl":null,"url":null,"abstract":"<p><p>Electrochemical Atomic Force Microscopy (EC-AFM) has become a powerful tool for visualising dynamic processes at electrode/electrolyte interfaces with a nanoscale resolution. This technique enables real-time monitoring of morphological, chemical, and structural changes in electrocatalysts under operating conditions, providing critical insights into the mechanisms of electrocatalytic reactions. In this review, I introduce some applications of EC-AFM in electrocatalysis research and experimental considerations. The applications include tracking catalyst surface reconstruction, adsorption/desorption dynamics of intermediate species, long-range probing of the electrochemical interface, and catalyst degradation analysis. Moreover, experimental challenges, including cantilever selection, liquid-phase imaging stability, and artefacts, are discussed. Bridging the gap between nanoscale imaging and electrochemical analysis, EC-AFM offers a unique pathway to unravel complex interfacial phenomena critical for the design of next-generation electrocatalysts.</p>","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":" ","pages":""},"PeriodicalIF":1.9000,"publicationDate":"2025-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of microscopy","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1111/jmi.13401","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MICROSCOPY","Score":null,"Total":0}
引用次数: 0

Abstract

Electrochemical Atomic Force Microscopy (EC-AFM) has become a powerful tool for visualising dynamic processes at electrode/electrolyte interfaces with a nanoscale resolution. This technique enables real-time monitoring of morphological, chemical, and structural changes in electrocatalysts under operating conditions, providing critical insights into the mechanisms of electrocatalytic reactions. In this review, I introduce some applications of EC-AFM in electrocatalysis research and experimental considerations. The applications include tracking catalyst surface reconstruction, adsorption/desorption dynamics of intermediate species, long-range probing of the electrochemical interface, and catalyst degradation analysis. Moreover, experimental challenges, including cantilever selection, liquid-phase imaging stability, and artefacts, are discussed. Bridging the gap between nanoscale imaging and electrochemical analysis, EC-AFM offers a unique pathway to unravel complex interfacial phenomena critical for the design of next-generation electrocatalysts.

电催化剂/电解质界面的时空可视化与电化学原子力显微镜:应用和笔记。
电化学原子力显微镜(EC-AFM)已经成为一种强大的工具,可以在纳米级分辨率下可视化电极/电解质界面的动态过程。该技术可以实时监测电催化剂在操作条件下的形态、化学和结构变化,为电催化反应的机制提供重要的见解。本文介绍了EC-AFM在电催化研究中的一些应用及实验注意事项。其应用包括跟踪催化剂表面重构、中间物质的吸附/解吸动力学、电化学界面的远程探测以及催化剂降解分析。此外,实验挑战,包括悬臂梁的选择,液相成像稳定性和人工制品,进行了讨论。EC-AFM弥补了纳米级成像和电化学分析之间的差距,提供了一种独特的途径来揭示复杂的界面现象,这对设计下一代电催化剂至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
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