Ondrej Dyck, Olugbenga Olunloyo, Kai Xiao, Benjamin Wolf, Thomas M. Moore, Andrew R. Lupini, Stephen Jesse
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引用次数: 0
Abstract
This study presents the design and implementation of a side entry laser system designed for an ultrahigh vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can be easily aligned, modified or exchanged without disturbing the vacuum. The system uses a mirror mounted on the sample holder such that the sample can be illuminated without being tilted. Notably the mirror can be removed and replaced with an ablation target and a higher power laser used to ablate material directly onto the sample. The authors argue that new capabilities hold the potential to transform the electron microscope from an analysis tool toward a more flexible synthesis system, where atomic scale fabrication and atom-by-atom experiments can be performed.
期刊介绍:
Advanced Materials Technologies Advanced Materials Technologies is the new home for all technology-related materials applications research, with particular focus on advanced device design, fabrication and integration, as well as new technologies based on novel materials. It bridges the gap between fundamental laboratory research and industry.