The Influence of Average Effective Emissivity in the Determination of Radiance Temperature of a Surface

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION
MAPAN Pub Date : 2025-02-02 DOI:10.1007/s12647-025-00806-0
D. Cywiak-Córdova, D. Cárdenas-García, E. Martines-López, H. Rodríguez-Arteaga
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Abstract

The radiance temperature, determined using a radiation thermometer, depends on the spectral emissivity of the measured surface. If the surface is opaque, to determine its temperature from the signal measured by the thermometer, it is common to use the approximation of an average effective emissivity, weighted over the spectral range of operation of the thermometer, and to consider the average effective reflectivity as its complement, such that the sum of their values is one. We found that, when the spectral emissivity of the surface has relevant variations, such consideration can induce noticeable deviations in the calculated radiance temperature, so besides the average effective emissivity, a true effective reflectivity should be calculated as well. By using the real spectral emissivity values of two different surfaces, we performed numerical calculations of the deviations on the estimated radiance temperature, due to the approximation described above, for different common wavelengths and thermometer spectral responses. We found that for a ceramic sample of known spectral emissivity, the above approximation led to deviations in the estimated radiance temperature of 1.4 K at 348.15 K and 2 K at 723.15 K.

Abstract Image

平均有效发射率对表面辐射温度测定的影响
用辐射温度计测定的辐射温度取决于被测表面的光谱发射率。如果表面是不透明的,为了根据温度计测量的信号确定其温度,通常使用平均有效发射率的近似值,在温度计工作的光谱范围上加权,并考虑平均有效反射率作为其补充,使它们的值之和为1。我们发现,当地表的光谱发射率有相关变化时,这种考虑会导致计算的辐射温度出现明显偏差,因此除了计算平均有效发射率外,还需要计算真实的有效反射率。我们利用两个不同表面的实际光谱发射率值,对不同常见波长和温度计光谱响应进行了数值计算,计算了由于上述近似导致的估计辐射温度的偏差。我们发现,对于已知光谱发射率的陶瓷样品,上述近似导致估计的辐射温度在348.15 K时为1.4 K,在723.15 K时为2 K。
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来源期刊
MAPAN
MAPAN 工程技术-物理:应用
CiteScore
2.30
自引率
20.00%
发文量
91
审稿时长
3 months
期刊介绍: MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
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