X-Ray Phase Analysis of Composites after Temperature Modification of Titanium Dioxide with Melamine at Different Quantities of Initial Components

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
I. B. Dorosheva, S. A. Petrova, A. A. Rempel’
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引用次数: 0

Abstract

Composites based on melamine and titanium dioxide at different initial ratios 4 : 1, 6 : 1, 8 : 1, and 10 : 1 were obtained by polymerization in air at a temperature of 550°C. The morphology of the samples was investigated, and the elemental mapping of the sample composition was carried out using scanning electron microscopy. It was found that the initial melamine particles have a size of more than 20 μm, and its polymerization leads to the formation of g-C3N4 layers up to 5 μm in size. TiO2 particles have an average size of 150 nm, and the resulting g-C3N4/TiO2 heterostructures consist of particles with a size of 20–30 nm, which form agglomerates of about 2 μm in size. It was shown that the specific surface area decreases from 67 to 41 m2/g with increasing melamine content in the initial mixture. A single-phase composition TiN0.24O1.88 was formed when the initial components were mixed at a ratio of 4 : 1. When the ratio of the initial melamine and titanium dioxide was increased to 8 : 1 and 10 : 1, a two-phase system was formed, which consisted of Ti0.72O2 in an amount from 12 to 13% and C3N4 in an amount from 87 to 88%. During synthesis at a ratio of 6 : 1, two phases were also formed, but the C3N4 content in it was significantly less, up to 5%.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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