Mathematical Model of Radiation Conductivity and Electron Emission in Wide-Gap Dielectrics

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
A. V. Berezin, V. M. Kanevskij, I. A. Tarakanov
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引用次数: 0

Abstract

A complete mathematical model of the generation of radiation and electromagnetic effects inside crystalline dielectrics and at their surface has been constructed. The case of exposure to powerful flows of soft X-ray radiation is considered. The mathematical model is based on the photon and electron transport equations, kinetic equations for photoelectrons, and semi-classical kinetic equations for secondary charge carriers. The system of equations is closed by self-consistent Maxwell equations. The transport equations consider in detail the processes of the electron-photon cascade. For secondary charge carriers, conduction electrons, and valence band holes, the processes of scattering by phonons are taken into account. A comparison of the results obtained using simpler models with the results of applying the complete mathematical model is provided.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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