Controlled Nanostructuring of Thin Films by Oblique Angle Deposition

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
O. S. Trushin, I. S. Fattakhov, M. M. Chebokhin, A. A. Popov, L. A. Mazaletskiy
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引用次数: 0

Abstract

Using electron beam evaporation, thin films of various compositions (Al, Co, Ge, SiO2) were obtained on inclined Si(001) substrates. It was found that at angles of incidence of the evaporated material on the substrate of more than 70° (sliding deposition), arrays of free-standing inclined nanocolumns with lateral dimensions from 10 to 100 nm and an aspect ratio (length/transverse dimension) of at least 10 were formed on the substrate. When substrate rotation was switched on during film growth, an array of nanospirals twisted in one direction was formed. Such films are chiral metamaterials and show pronounced optical activity. Simulation of film growth processes under oblique angle deposition conditions using the Monte Carlo method showed good qualitative agreement with the experimental data. It was found that the observed processes of nanostructuring during oblique angle deposition are based on universal mechanisms of competition between growing crystalline grains under conditions of neighbor shading. This makes it possible to obtain nanostructured films of various materials with the required functional characteristics under such conditions.

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通过斜角沉积实现薄膜的可控纳米结构化
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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