Analysis of Crystalline Phases of Electroactive Forms of a Composite of Polyvinylidene Fluoride and Tetrafluoroethylene Copolymer with Nanographite

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-01 DOI:10.1134/S1027451024701234

V. I. Bachurin, N. G. Savinski, A. P. Khramov, M. A. Smirnova, R. V. Selyukov

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Abstract

The work examines the effect of crystallization conditions of vinylidene fluoride (VDF) and tetrafluoroethylene (TFE) copolymer (F-42) from aprotic solvents (dimethyl sulfoxide (DMSO) and dimethylformamide (DMF)) under isothermal conditions at temperatures of 60, 90, and 150°C on the phase composition of the films. The content of crystalline phases in F-42 films is analyzed using Fourier-transform infrared spectroscopy, Raman spectroscopy, and X-ray phase analysis. The effect of nanographite fillers on the crystalline phases of the copolymer films is also studied. Nanographite fillers alter the crystalline structure of the polymer piezoelectric films and their piezoelectric properties, forming electroactive β and γ phases with high content during crystallization from 5-wt-% solutions of aprotic solvents. Some analytical features of the crystalline allotrope phase content are identified using these methods. The total content of crystalline electroactive phases in the VDF/TFE copolymer during isothermal crystallization from DMSO and DMF is 96–98%, while the β-phase content is 75–80%.

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.