Effect of Annealing on the Microstructure and Structural-Phase State of Nanoscale Multilayer Zr/Nb Coatings after Irradiation with He+ Ions

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-01 DOI:10.1134/S1027451024701404

R. S. Laptev, E. N. Stepanova, A. D. Lomygin, D. G. Krotkevich, A. A. Sidorin, O. S. Orlov

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引用次数: 0

Abstract

Radiation degradation is a serious problem affecting the service life of many structural materials used in harsh environments. Modern research is aimed at developing materials with improved mechanical and physical properties, as well as increased resistance to radiation damage. Nanoscale multilayer coatings are one such material. The effect of annealing on the microstructure, defect structure, and mechanical properties of nanoscale multilayer materials consisting of alternating Zr and Nb layers after irradiation with He⁺ ions was studied. Multilayers Zr/Nb materials were prepared by magnetron sputtering, with the thickness of each layer being 50 nm. Analysis was performed using the following techniques: positron annihilation spectroscopy, X-ray diffraction analysis, and high-resolution transmission electron microscopy. Defects in the structure were investigated layer by layer using a variable energy positron beam and Doppler broadening spectroscopy. Analysis of changes in nanohardness, Young’s modulus, and structural-phase state has shown that the multilayer structure is preserved in Zr/Nb multilayers with a thicknesses of individual layer of 50 nm after irradiation with He⁺ ions and subsequent annealing in the range from 100 to 300°C.

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用 He+ 离子照射后退火对纳米级多层 Zr/Nb 涂层微观结构和结构相态的影响

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.