Ion Beam Emittance Measurements of Proton Injector for Compact Neutron Source DARIA

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
S. S. Vybin, I. V. Izotov, V. A. Skalyga, A. V. Polyakov, A. F. Bokhanov
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Abstract

This article is devoted to measurement of proton beam parameters as one of the stages of proton injector for linear accelerator of compact neutron source DARIA development. Experimental results of ion source operating modes investigation are presented in this work. Gasdynamic electron-cyclotron resonance ion source GISMO is used as a proton injector. The plasma of the ion source is characterized as dense (the electron density is about 1013 cm–3) and hot (the electron temperature is about 30 eV). High volumetric energy input in plasma (up to 250 W cm–3) is achieved by the use of powerful “technological” gyrotron radiation to the plasma heating. The total ion beam current and beam emittance measurements were conducted during experiment at different facility parameters: inlet gas pressure, microwave power, magnetic lens current, and extraction voltage. The beam emittance was measured using pepper-pot method. The optimal ion source operation mode was found. The total beam current was above 100 mA at the proton beam energy of 40 keV, and the root-mean square normalized emittance was 0.21 π mm mrad. The obtained results of measurements are beneficial from the point of view of possibilities to control the ion source operating modes.

Abstract Image

用于紧凑型中子源 DARIA 的质子注入器的离子束发射率测量
本文介绍了紧凑型中子源直线加速器DARIA研制中质子注入器的质子束参数测量。本文给出了离子源工作模式研究的实验结果。采用气动力电子回旋共振离子源GISMO作为质子注入器。离子源的等离子体具有致密(电子密度约为1013 cm-3)和热(电子温度约为30 eV)的特点。等离子体中的高体积能量输入(高达250 W cm-3)是通过使用强大的“技术”回旋管辐射来加热等离子体实现的。实验中,在不同的设备参数:入口气体压力、微波功率、磁透镜电流和萃取电压下,测量了总离子束电流和束流发射度。采用胡椒罐法测量光束发射度。找到了最佳离子源工作模式。质子束能量为40 keV,总束流大于100 mA,均方根归一化发射度为0.21 π mm mrad。从控制离子源工作模式的可能性的角度来看,获得的测量结果是有益的。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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