Time-of-Flight Neutron Reflectometer for the DARIA Compact Neutron Source: Monte Carlo Simulation

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
N. A. Grigoryeva, N. A. Kovalenko, S. V. Grigoriev
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引用次数: 0

Abstract

Two types of polarized neutron reflectometers have been simulated for the compact neutron source DARIA (Dedicated for Academical Research and Industrial Application), depending on the type of target assembly with thermal or cryogenic moderators. Modeling and optimization of reflectometers were carried out using McStas software package by the Monte Carlo method with specified momentum transfer resolution Δq/q ≤ 5% for reflection angles greater than the critical angle θcr and a neutron beam horizontal divergence of Δθ ≤ 0.1° for θ < θcr and Δθ ≤ 0.033° for θ > θcr. To reduce losses in neutrons, neutron guides with a supermirror coating have been proposed. A system of choppers makes it possible to create a neutron spectrum of the required width on a sample.

Abstract Image

DARIA紧凑型中子源的飞行时间中子反射计:蒙特卡罗模拟
针对紧凑中子源DARIA(专用于学术研究和工业应用),根据目标组件的类型,分别模拟了两种类型的极化中子反射计。利用McStas软件包采用蒙特卡罗方法对反射计进行建模和优化,当反射角大于临界角θcr时,动量传递分辨率为Δq/q≤5%,θ <时中子束水平散度为Δθ≤0.1°;θ > θcr和Δθ≤0.033°;θcr。为了减少中子的损失,人们提出了一种带有超镜面涂层的中子波导。剪切系统使得在样品上产生所需宽度的中子谱成为可能。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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