Features of the Physical Properties of Film Structures Based on Tungsten Nanofilms with Various Phase Composition

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-01 DOI:10.1134/S1027451024701180

A. V. Prokaznikov, R. V. Selyukov, V. A. Paporkov

引用次数: 0

Abstract

The study examines the electrophysical properties of thin tungsten films deposited by magnetron sputtering, focusing on their thickness, substrate material, phase composition, and structure. The observed patterns indicate the polycrystalline nature of the films, the presence of two tungsten phases, and the isotropy of the magneto-optical properties of thin cobalt films deposited onto tungsten. The dependence of the resistivity on the thickness of the tungsten films and the substrate material is investigated both experimentally and theoretically, demonstrating the dominant contribution of charge-carrier transport across crystallite boundaries.

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基于不同相组成的钨纳米膜的薄膜结构的物理性质特征

研究了磁控溅射制备的钨薄膜的电物理性能，重点研究了薄膜的厚度、衬底材料、相组成和结构。观察到的模式表明薄膜的多晶性质，两个钨相的存在，以及沉积在钨上的薄钴膜的磁光性质的各向同性。实验和理论研究了电阻率与钨薄膜和衬底材料厚度的关系，证明了电荷载流子跨晶界输运的主要贡献。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.