Design of Ion Beam Electrostatic Modulation System

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
D. M. Smagin, S. S. Vybin, I. V. Izotov, A. V. Polyakov, V. A. Skalyga
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Abstract

This article is devoted to a stage of pulsed proton injector development which is conducted at the Gaponov-Grekhov Institute of Applied Physics, Russian Academy of Sciences. The result of electrostatic chopper numerical modeling is presented. It is a part of proton injector for linear accelerator of compact neutron source DARIA. A continuous wave mode gasdynamic electron cyclotron resonance ion source GISMO is used as an injector. The ion source has high volumetric energy input into plasma due to the use of “technological” gyrotron radiation to maintain and heat the plasma. The optimal geometric parameters (deflecting plates size and distance between them) of electrostatic chopper are determined during the calculations of proton beam propagation through the injector. The minimal voltage, which is enough for full beam deflection without losses inside chopper, is achieved at the optimal chopper geometry. Also, the output beam current dependence on chopper plate voltage is studied. The calculations allow for determining temporal characteristics of pulsed proton beam which escapes the injector at known pulse parameters of chopper voltage supply source.

Abstract Image

本文主要介绍俄罗斯科学院加波诺夫-格列霍夫应用物理研究所(Gaponov-Grekhov Institute of Applied Physics)开发脉冲质子喷射器的一个阶段。文中介绍了静电斩波器数值建模的结果。它是紧凑型中子源 DARIA 直线加速器质子注入器的一部分。连续波模式气体动力电子回旋共振离子源 GISMO 被用作注入器。由于使用了 "技术 "陀螺辐射来维持和加热等离子体,离子源输入等离子体的体积能量很高。静电斩波器的最佳几何参数(偏转板尺寸和它们之间的距离)是在计算质子束在注入器中的传播过程中确定的。在最佳斩波器几何参数下,可以获得最小电压,该电压足以使质子束完全偏转而不会在斩波器内部产生损耗。此外,还研究了输出束流与斩波板电压的关系。通过计算,可以确定在已知斩波器电压源脉冲参数的情况下,脉冲质子束从注入器逸出的时间特性。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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