Lorenz system manufacturing with a Butterworth filter

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
L.L. Jiménez-Zacarías , I. Campos-Cantón
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引用次数: 0

Abstract

This paper investigates the Lorenz system x state equation duality, with a first-order RC passive low-pass filter to propose a new Lorenz type system. This new Lorenz type system is done electronically; to fulfill this objective, an electronic circuit is developed using a Butterworth, Chebyshev, and second order RC filter replacing the x state low pass filter. The electronic circuit is simulated using Multisim software. Bifurcation diagrams, Lyapunov exponents, and phase portrait techniques are used to confirm the chaotic circuit behavior. It is found that the Lorenz system produces chaos if the second-order RC filter associated with the x state is tuned to a 10 rad/sec cutoff frequency, whereas it should be 28 rad/sec for the Butterworth filter and 40 rad/sec for the Chebyshev filter.
用巴特沃斯滤波器制造洛伦兹系统
本文研究了Lorenz系统x状态方程的对偶性,利用一阶RC无源低通滤波器提出了一种新的Lorenz型系统。这个新的洛伦兹型系统是电子完成的;为了实现这一目标,开发了一个电子电路,使用巴特沃斯,切比雪夫和二阶RC滤波器取代x状态低通滤波器。利用Multisim软件对电路进行仿真。分岔图,李雅普诺夫指数和相位肖像技术被用来确认混沌电路的行为。研究发现,如果与x态相关的二阶RC滤波器被调谐到10 rad/秒的截止频率,则洛伦兹系统会产生混沌,而巴特沃斯滤波器的截止频率应为28 rad/秒,切比雪夫滤波器的截止频率应为40 rad/秒。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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