Powder X-ray line diffraction pattern profiling of anatase-quartz binary oxide: A crystallographic investigation

Abstract

High-crystalline binary oxide of TiO₂ and SiO₂ was successfully synthesized using a simple, unique method involving titanium isopropoxide, silicon tetraethoxide and isopropyl alcohol (IP). The resulting crystalline preferred oriented powder was analyzed using X-ray diffraction (XRD). Rietveld refinement showed that the titania-silica (TS) crystalline binary oxide consisted of anatase and quartz phases with a composition of 49.40 % crystalline anatase and 50.60 % crystalline quartz. The pure titania-silica binary oxide (TSBO) had detailed lattice parameters: for anatase, α=β=γ=90.0°, a=b=3.7856 Å, c=9.5159 Å, lattice strain of 0.079 %, lattice volume of 136.372 ų and specific surface area of 20.0 m²/g with tetragonal crystal structure. For quartz, the parameters were α= β=90.0°, γ=120.0°, a=b=4.9143 Å, c=5.4059 Å, lattice strain of 0.012 %, lattice volume of 113.063 ų and specific surface area of 12.5 m²/g with hexagonal crystal structure. The most intense diffractions were associated with the (101) plane at 2θ=25.289° for anatase and the (101) plane at 2θ=26.634° for quartz. The synthesized material exhibited peak in UV absorbance at 324.50 nm (0.783 a.u.) caused blue shift explored nano-size contribution and optical band gap of 3.071 eV. The zeta potential for +55.33 to −65.93 mV showed good stability of TSBO. The crystallographic data verified the successful synthesis of pure TSBO contributing to advancements in nanotechnology.