On the Effect of Memory Error in a Time-Interleaved Pipeline ADC With a Shared Residue Amplifier

IF 4 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Debajit Basak;Siji Huang;George Yuan
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Abstract

Compared to traditional time-interleaved (TI) pipeline ADC, shared residue amplifier (RA) architecture is potentially more power efficient and requires simpler calibration. However, the shared RA architecture suffers from memory error, which severely degrades its linearity. Typically, a reset phase is needed at the RA’s input to avoid this memory error. The reset phase is particularly problematic for high-speed ADCs as it shortens the amplification time, leading to higher power consumption in the RA. This brief analyzes the effect of memory error and presents a simple digital memory correction technique for a reset-free and shared open-loop based pipeline ADC. A 14-bit TI pipeline-SAR ADC, running at 2 GS/s, is designed and fabricated to verify the proposed analysis and correction method. Experimental results show improvements of upto 5.1 dB in the signal-to-noise-and-distortion ratio (SNDR) and more than two times in the integral nonlinearity (INL) with the proposed digital memory correction technique.
基于共享剩余放大器的时间交错管道ADC中存储器误差的影响
与传统的时间交错(TI)管道ADC相比,共享剩余放大器(RA)架构具有更高的功耗效率和更简单的校准要求。然而,共享RA架构存在内存错误,严重降低了其线性度。通常,在RA的输入处需要一个重置阶段来避免这种内存错误。对于高速adc来说,复位阶段尤其成问题,因为它缩短了放大时间,导致RA的功耗更高。本文简要分析了内存误差的影响,并提出了一种简单的数字内存校正技术,用于无复位和共享开环的流水线ADC。设计并制作了一个运行速度为2gs /s的14位TI管道sar ADC,以验证所提出的分析和校正方法。实验结果表明,采用数字存储器校正技术,系统的信噪比(SNDR)提高了5.1 dB,积分非线性(INL)提高了2倍以上。
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来源期刊
IEEE Transactions on Circuits and Systems II: Express Briefs
IEEE Transactions on Circuits and Systems II: Express Briefs 工程技术-工程:电子与电气
CiteScore
7.90
自引率
20.50%
发文量
883
审稿时长
3.0 months
期刊介绍: TCAS II publishes brief papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes: Circuits: Analog, Digital and Mixed Signal Circuits and Systems Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic Circuits and Systems, Power Electronics and Systems Software for Analog-and-Logic Circuits and Systems Control aspects of Circuits and Systems.
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