Donghwan Seo;Jung-Geun Kim;Injune Yeo;Hyunkeun Lee;Byung-Geun Lee
{"title":"Analysis of Pixel Noise in Dynamic Vision Sensors","authors":"Donghwan Seo;Jung-Geun Kim;Injune Yeo;Hyunkeun Lee;Byung-Geun Lee","doi":"10.1109/TCSI.2025.3526965","DOIUrl":null,"url":null,"abstract":"To date, pixel noise in a dynamic vision sensor (DVS) has not been accurately analyzed in the literature, and its optimization has been performed empirically. This paper presents a theoretical analysis of the DVS pixel noise. The mean-squared noise voltage at the pixel output from each noise source in a pixel is mathematically derived and verified based on simulations and measurements. A design method to determine the pixel bias currents for a given photocurrent is also presented based on the noise analysis to improve noise performance while maintaining pixel latency. A prototype DVS chip was fabricated in a 110 nm complementary metal-oxide-semiconductor image sensor process and tested under various light and pixel bias conditions. It is shown that the proposed noise analysis and design method successfully predicted the noise performance of the DVS chip.","PeriodicalId":13039,"journal":{"name":"IEEE Transactions on Circuits and Systems I: Regular Papers","volume":"72 3","pages":"1081-1092"},"PeriodicalIF":5.2000,"publicationDate":"2025-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Circuits and Systems I: Regular Papers","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10843121/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
To date, pixel noise in a dynamic vision sensor (DVS) has not been accurately analyzed in the literature, and its optimization has been performed empirically. This paper presents a theoretical analysis of the DVS pixel noise. The mean-squared noise voltage at the pixel output from each noise source in a pixel is mathematically derived and verified based on simulations and measurements. A design method to determine the pixel bias currents for a given photocurrent is also presented based on the noise analysis to improve noise performance while maintaining pixel latency. A prototype DVS chip was fabricated in a 110 nm complementary metal-oxide-semiconductor image sensor process and tested under various light and pixel bias conditions. It is shown that the proposed noise analysis and design method successfully predicted the noise performance of the DVS chip.
期刊介绍:
TCAS I publishes regular papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes: - Circuits: Analog, Digital and Mixed Signal Circuits and Systems - Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic - Circuits and Systems, Power Electronics and Systems - Software for Analog-and-Logic Circuits and Systems - Control aspects of Circuits and Systems.