A Novel Parallel Feed-Forward Current Ripple Rejection (PFFCRR) Technique for High Load Current High PSRR nMOS LDOs

IF 2.8 2区 工程技术 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Yuhong Lu;Ting-An Yen;Rakshit Dambe Nayak;Shashank Alevoor;Bhushan Talele;Spoorti Patil;Keith Kunz;Bertan Bakkaloglu
{"title":"A Novel Parallel Feed-Forward Current Ripple Rejection (PFFCRR) Technique for High Load Current High PSRR nMOS LDOs","authors":"Yuhong Lu;Ting-An Yen;Rakshit Dambe Nayak;Shashank Alevoor;Bhushan Talele;Spoorti Patil;Keith Kunz;Bertan Bakkaloglu","doi":"10.1109/TVLSI.2024.3497803","DOIUrl":null,"url":null,"abstract":"There is a significant demand in systems-on-chip (SoCs) for a high-power efficiency low-dropout regulator (LDO) that provides lower dropout voltage, higher load current, and low quiescent current. A high-power supply rejection ratio (PSRR) at the mid-to-high frequency band (0.1–10 MHz) is crucial for LDO to generate low-noise power supplies when driven by switching power converters. However, this presents a significant challenge to enhancing the PSRR since the pass field-effect transistor (FET) operates in the deep triode region at high-current and dropout conditions. In this article, a parallel feed-forward current ripple rejection (PFFCRR) technique is proposed to improve the PSRR performance regardless of the operation region of the nMOS pass FET. The proposed approach senses the supply-induced current ripple and cancels the original ripple through a current path that runs parallel to the nMOS pass FET. The proposed LDO is fabricated in a 180-nm BCD process. The proposed LDO achieves a PSRR better than −35 dB up to 10 MHz at 300-mV dropout voltage with 0.5-A load current and a load capacitor of <inline-formula> <tex-math>$2.2~\\mu $ </tex-math></inline-formula>F. The PFFCRR approach achieves a PSRR improvement of 18 dB at 1 MHz at 100-mV dropout voltage with a 2.15-A load current when the pass FET operates in the deep triode region. Moreover, the proposed LDO enhances the transient performance with an overshoot and an undershoot of 40.54 and 36.45 mV, respectively, against <inline-formula> <tex-math>$\\Delta {I}_{\\text {LOAD}}$ </tex-math></inline-formula> of 1 A with a slew rate of 1 A/<inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula>s.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"33 3","pages":"651-661"},"PeriodicalIF":2.8000,"publicationDate":"2024-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10769013/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0

Abstract

There is a significant demand in systems-on-chip (SoCs) for a high-power efficiency low-dropout regulator (LDO) that provides lower dropout voltage, higher load current, and low quiescent current. A high-power supply rejection ratio (PSRR) at the mid-to-high frequency band (0.1–10 MHz) is crucial for LDO to generate low-noise power supplies when driven by switching power converters. However, this presents a significant challenge to enhancing the PSRR since the pass field-effect transistor (FET) operates in the deep triode region at high-current and dropout conditions. In this article, a parallel feed-forward current ripple rejection (PFFCRR) technique is proposed to improve the PSRR performance regardless of the operation region of the nMOS pass FET. The proposed approach senses the supply-induced current ripple and cancels the original ripple through a current path that runs parallel to the nMOS pass FET. The proposed LDO is fabricated in a 180-nm BCD process. The proposed LDO achieves a PSRR better than −35 dB up to 10 MHz at 300-mV dropout voltage with 0.5-A load current and a load capacitor of $2.2~\mu $ F. The PFFCRR approach achieves a PSRR improvement of 18 dB at 1 MHz at 100-mV dropout voltage with a 2.15-A load current when the pass FET operates in the deep triode region. Moreover, the proposed LDO enhances the transient performance with an overshoot and an undershoot of 40.54 and 36.45 mV, respectively, against $\Delta {I}_{\text {LOAD}}$ of 1 A with a slew rate of 1 A/ $\mu $ s.
求助全文
约1分钟内获得全文 求助全文
来源期刊
CiteScore
6.40
自引率
7.10%
发文量
187
审稿时长
3.6 months
期刊介绍: The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society. Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels. To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信