{"title":"Analysis and Design of Ripple-Free Bandgap Reference Circuit With p-n-p Bipolars","authors":"Srishti Agrawal;Rakesh Kumar Palani;Sweta Tripathi","doi":"10.1109/TVLSI.2024.3463696","DOIUrl":null,"url":null,"abstract":"This article presents a chopperless ripple-free low-noise bandgap reference (BGR) circuit in a traditional CMOS process that uses only p-n-p bipolars. Almost all chopperless bandgap structures require the use of n-p-n bipolars in special twin well processes, and they are prone to substrate and power supply noise. This work has targeted the “chopperless” scenario in p-n-p bipolar-based bandgap architecture by presenting a low offset temperature coefficient (TC) preamplifier design in the error amplifier. Notably, the design’s worst case power supply rejection (PSR) was “derived, simulated, and experimentally measured” to be −35 dB at 7.5 MHz, which is above par with any previously designed circuits. Furthermore, for the first time, an extensive mathematical analysis is provided for the self-bias loop, which is traditionally used to suppress the systematic offset. The prototype implemented in the TSMC 65-nm low-power (LP) process is untrimmed and occupies an active area of 0.0226 mm2 while drawing a current of <inline-formula> <tex-math>$48.36~\\mu $ </tex-math></inline-formula>A from 0.9-V supply. Measurement results of 28 chips and 10 chips in two different wafers show that the achieved nominal reference voltage of 500 mV has an average accuracy of 27 ppm/°C, similar to the curvature uncompensated BGR that uses chopping. Furthermore, the measured noise spectral density at 1-Hz offset is <inline-formula> <tex-math>$10~\\mu $ </tex-math></inline-formula>V/<inline-formula> <tex-math>$\\sqrt {(}\\text {Hz})$ </tex-math></inline-formula>, which is the state of the art among chopperless bandgap structures.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"33 3","pages":"697-706"},"PeriodicalIF":2.8000,"publicationDate":"2024-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10706624/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
This article presents a chopperless ripple-free low-noise bandgap reference (BGR) circuit in a traditional CMOS process that uses only p-n-p bipolars. Almost all chopperless bandgap structures require the use of n-p-n bipolars in special twin well processes, and they are prone to substrate and power supply noise. This work has targeted the “chopperless” scenario in p-n-p bipolar-based bandgap architecture by presenting a low offset temperature coefficient (TC) preamplifier design in the error amplifier. Notably, the design’s worst case power supply rejection (PSR) was “derived, simulated, and experimentally measured” to be −35 dB at 7.5 MHz, which is above par with any previously designed circuits. Furthermore, for the first time, an extensive mathematical analysis is provided for the self-bias loop, which is traditionally used to suppress the systematic offset. The prototype implemented in the TSMC 65-nm low-power (LP) process is untrimmed and occupies an active area of 0.0226 mm2 while drawing a current of $48.36~\mu $ A from 0.9-V supply. Measurement results of 28 chips and 10 chips in two different wafers show that the achieved nominal reference voltage of 500 mV has an average accuracy of 27 ppm/°C, similar to the curvature uncompensated BGR that uses chopping. Furthermore, the measured noise spectral density at 1-Hz offset is $10~\mu $ V/$\sqrt {(}\text {Hz})$ , which is the state of the art among chopperless bandgap structures.
期刊介绍:
The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society.
Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.
To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.