A novel error compensation method for a redundant parallel mechanism based on adaptive differential evolution algorithm and RBF neural network

IF 3.5 2区 工程技术 Q2 ENGINEERING, MANUFACTURING
Chen-dong Zeng, Zhi-cheng Qiu, Fen-hua Zhang, Xian-min Zhang
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引用次数: 0

Abstract

Accuracy plays an important role in the advanced industrial application of parallel mechanisms, and the related research is valuable. Taking a (6 + 3)-DOF kinematic redundant parallel mechanism (KRPM) as an example, a novel error compensation method is proposed. Firstly, the error model of the KRPM is established based on vector method. Secondly, adaptive differential evolution (ADE) algorithm and radial basis function neural network (RBFNN) are introduced, and they are combined as a novel error compensation method. Numerical simulation is carried out based on three cases, and compared with typical error compensation method, which verifies the effectiveness of the proposed method. Finally, the experiments are conducted based on laser tracker to verify the proposed method. Under the proposed method, the average effect of error prediction can reach 90.2 %, which is better than the typical error compensation method. After error compensation, the pose error of the KRPM is significantly reduced.
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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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