Actuator Fault Detection and Identification Using H-Infinity Filter

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Ndabarushimana Egone, Ma Lei
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引用次数: 0

Abstract

Open-circuit faults (OCFs) in insulated gate bipolar transistors (IGBTs) within single-phase pulse width modulation (PWM) rectifiers can severely degrade system performance, leading to reduced output voltage, poor power quality, overheating, and safety risks, including electric shocks or fires. Reliable fault detection is critical for maintaining system efficiency and preventing further damage. This study presents an advanced fault detection method based on the H-infinity (H∞) approach, utilizing an extended H∞ filter to monitor system behavior and generate residual signals indicative of faults. The method effectively filters out external disturbances and system noise, minimizing false positives and enhancing detection accuracy. The proposed method was evaluated through hardware-in-the-loop (HIL) simulations that replicated real-world conditions of PWM rectifiers. Results show that the extended H∞ filter successfully detected OCFs with high accuracy and reduced false alarm rates. Performance metrics indicate a significant improvement in detection reliability compared to conventional methods. In conclusion, the H∞-based fault detection method offers a robust solution for real-time monitoring in power electronic systems. It enhances fault detection accuracy, reduces false alarms, and improves the operational safety and reliability of single-phase PWM rectifiers. Integrating this technique into power systems can mitigate risks associated with IGBT failures and ensure optimal performance under varying operational conditions.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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