{"title":"Re-entrainment mechanism of submicron particles during electrostatic capture process","authors":"Yong Zhu, Zhenpeng Huang, Shanlong Tao, Jitong Chen, Xiaoyong Yang, Wei Yin, Wenfeng Shangguan, Zhishan Bai","doi":"10.1016/j.ces.2025.121417","DOIUrl":null,"url":null,"abstract":"In this work, a controllable electric field with plate-plate structure, whose ratio between plate length and plate-plate spacing can reach up to be 65 for mostly possible capture of targeted particles, is firstly established in laboratory level for investigating the re-entrainment mechanism of submicron particles. Computational fluid dynamic and response surface method are employed to analyze the distribution characteristics of multiple physical fields and the influence of various parameters on particle re-entrainment effect. Experimental results indicate that particle concentration decreases gradually, which follows three distinct stages of particle motion: the acceleration stage, linear motion stage, and re-entrainment stage. Gas velocity is identified as the most significant factor affecting particle re-entrainment, while charger current has a relatively minor effect. A reliable regression model for theoretical collection length has been developed and validated against experimental data, providing credible predictive values for the required collection length to capture most submicron particles","PeriodicalId":271,"journal":{"name":"Chemical Engineering Science","volume":"209 1","pages":""},"PeriodicalIF":4.1000,"publicationDate":"2025-02-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Chemical Engineering Science","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1016/j.ces.2025.121417","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, CHEMICAL","Score":null,"Total":0}
引用次数: 0
Abstract
In this work, a controllable electric field with plate-plate structure, whose ratio between plate length and plate-plate spacing can reach up to be 65 for mostly possible capture of targeted particles, is firstly established in laboratory level for investigating the re-entrainment mechanism of submicron particles. Computational fluid dynamic and response surface method are employed to analyze the distribution characteristics of multiple physical fields and the influence of various parameters on particle re-entrainment effect. Experimental results indicate that particle concentration decreases gradually, which follows three distinct stages of particle motion: the acceleration stage, linear motion stage, and re-entrainment stage. Gas velocity is identified as the most significant factor affecting particle re-entrainment, while charger current has a relatively minor effect. A reliable regression model for theoretical collection length has been developed and validated against experimental data, providing credible predictive values for the required collection length to capture most submicron particles
期刊介绍:
Chemical engineering enables the transformation of natural resources and energy into useful products for society. It draws on and applies natural sciences, mathematics and economics, and has developed fundamental engineering science that underpins the discipline.
Chemical Engineering Science (CES) has been publishing papers on the fundamentals of chemical engineering since 1951. CES is the platform where the most significant advances in the discipline have ever since been published. Chemical Engineering Science has accompanied and sustained chemical engineering through its development into the vibrant and broad scientific discipline it is today.