Power-efficient SAR ADC with noise-reduction scheme based on kT/C noise cancellation and adaptive tracking averaging

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Anji Huang , Gefeng Zeng , Yi Shen , Angyang Li , Libo Qian , Qing Zou , Zheng Qiu , Min Wang , Shubin Liu , Ruixue Ding , Yinshui Xia , Zhangming Zhu
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引用次数: 0

Abstract

Conventional successive approximation register (SAR) ADCs encounter a compromise between accuracy and power consumption. This work presents an efficient noise-reduction scheme to mitigate sampling noise and comparator noise. The kT/C noise cancellation technique reduces the kT/C noise and facilitates the reduction of the sampling capacitance to one-sixth of its typical value in conventional architectures. LSB repeating and adaptive tracking averaging(ATA) technique are also employed to decouple the correlation between the energy and the noise in the comparator. Post-simulation results indicate that the signal-to-noise distortion ratio (SNDR) and spurious-free dynamic range (SFDR) of the proposed 14-bit prototype SAR ADC attain values of 84.5 dB and 95.5 dB respectively at a Nyquist input rate and a sampling rate of 1 MS/s. The power consumption is 431.6 μW with a 1.8 V power supply, resulting in a “Walden” figure of merit (FoMw) of 35.7 fJ/conv-step and a “Schreier” figure of merit (FoMs) of 173.3 dB in a 0.18-μm CMOS process.
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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