Monte Carlo simulations of energy dispersive X-ray fluorescence (EDXRF) of liquid and metallic samples: A comparison and experimental validation of MCNP and XRMC codes
P. Zambianchi , M. Antoniassi , F.L. Melquiades , J.K. Zambianchi
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引用次数: 0
Abstract
The present study compares numerical simulations carried out by two Monte Carlo codes, the Monte Carlo N-Particle (MCNP) and the XRMC, of Energy Dispersive X-ray fluorescence (EDXRF) excited in liquid and metallic samples. The results are validated by measurements with a laboratory-made equipment, consisting of a mini X-ray tube (Moxtek, Inc., 4 W, Ag target) and a Si PIN detector model X123 (Amptek, Inc.), configured in the usual 45°/45° geometry. The liquid sample was a multielementar stock solution from High Purity Standards containing traces of the transition metals Cu, Fe, Mn, and Zn. For the solid samples, two metallic plates of standard reference materials were used, namely, a) a rectangular plate (6.9 mm × 43.4 mm, 1.5 mm thick) made of high purity copper; and b) a steel alloy plate (Duplex 2205 CRM) containing Si, Cr, Mn, Fe, Ni, Cu and Mo in its composition. The quantitative analysis of the relative peak intensities between the simulations and experiment reveals a difference of 0.4 % to 12.3 %, depending on the elemental characteristic line and sample composition. The results show an overall very good agreement between the simulations of the MCNP and XRMC codes with the experimental spectra, making them suitable for typical EDXRF applications involving metallic samples and multielement aqueous solutions.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.