Electrostatic Field by Thunderclouds: Threat at Ground Level

IF 2.5 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Erika Stracqualursi;Gianfranco Di Lorenzo;Rodolfo Araneo;Giampiero Lovat;Salvatore Celozzi
{"title":"Electrostatic Field by Thunderclouds: Threat at Ground Level","authors":"Erika Stracqualursi;Gianfranco Di Lorenzo;Rodolfo Araneo;Giampiero Lovat;Salvatore Celozzi","doi":"10.1109/TEMC.2025.3535669","DOIUrl":null,"url":null,"abstract":"The physics of charge formation and separation within clouds prior to lightning events is still not fully understood. The common and practical, simplified approach based on three lumped charges may conduct to unrealistic predictions, which do not match measured data. An accurate model considering distributed charges in several layers is more in line with actual measurements of charge distributions conducted all over the world and may be used to predict the stress acting upon electrical structures at ground level. Because of the large dispersion of measured situations as a consequence of the stochastic nature of the involved phenomena, a statistical approach is devised and adopted to numerically evaluate the electric field impinging on and the electric potential stressing insulators of a typical medium voltage overhead line without shield wire, located below a thundercloud.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 3","pages":"719-728"},"PeriodicalIF":2.5000,"publicationDate":"2025-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10896880","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10896880/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

The physics of charge formation and separation within clouds prior to lightning events is still not fully understood. The common and practical, simplified approach based on three lumped charges may conduct to unrealistic predictions, which do not match measured data. An accurate model considering distributed charges in several layers is more in line with actual measurements of charge distributions conducted all over the world and may be used to predict the stress acting upon electrical structures at ground level. Because of the large dispersion of measured situations as a consequence of the stochastic nature of the involved phenomena, a statistical approach is devised and adopted to numerically evaluate the electric field impinging on and the electric potential stressing insulators of a typical medium voltage overhead line without shield wire, located below a thundercloud.
雷雨云静电场:对地面的威胁
在闪电发生之前,云内电荷形成和分离的物理原理仍未完全了解。基于三个集总电荷的通用和实用的简化方法可能导致不切实际的预测,这些预测与测量数据不匹配。考虑多层分布电荷的精确模型更符合在世界各地进行的电荷分布的实际测量,可用于预测作用在地面电结构上的应力。由于所涉及的现象具有随机性,所测量的情况具有较大的离散性,因此设计并采用了一种统计方法,对雷雨云下无屏蔽线的典型中压架空线绝缘子上的冲击电场和应力电势进行了数值计算。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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