ZnO/MgO Schottky ultraviolet photodetector with high on/off ratio

IF 2.7 Q2 PHYSICS, CONDENSED MATTER
Jiaojiao Liu , Qiuliang Zhong , Cheng Wu , Zhenbo Chen , Xiaoming Yu , Xuan Yu , Hai Zhang , Yu Cao , Zhenhua Li , Qian Qiao , Yingtang Zhou
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Abstract

Low-cost, high-performance zinc oxide (ZnO) Schottky ultraviolet (UV) photodetectors (PDs) have garnered significant interest. However, due to the existence of defect states in solution-processed ZnO, the reduced carrier mobility limits the device's performance and further application. In this study, Schottky UV PDs were successfully prepared based on the ZnO/MgO composite films. The ZnO/MgO composite film's surface has a “gully” appearance when compared to the original ZnO thin films. The accumulation of uniform-sized grains creates irregular strip bumps, which increases the film's surface area and, consequently, its overall quality. The composite film exhibits excellent UV light absorption from 330 to 360 nm, and the reduced internal resistance results in fewer defects facilitating carrier migration. These superior characteristics significantly improve the device's photoelectric performance. It is worth noting that the device on/off ratio increases by 39 times (from 2.77 to 111.46), the noise equivalent power (NEP) and the normalized detectivity (D∗) decrease and increase by one order of magnitude, respectively, as the applied voltage increases from 1 to 2 V. Furthermore, the responsivity is improved by 3 times (from 0.46 to 1.88 mA W−1), and response time is reduced by 42 %. This work provides a new idea for developing high-performance ZnO Schottky UV photodetectors.
高开/关比ZnO/MgO肖特基紫外探测器
低成本、高性能氧化锌(ZnO)肖特基紫外(UV)光电探测器(pd)已经引起了人们极大的兴趣。然而,由于溶液处理ZnO中存在缺陷态,载流子迁移率的降低限制了器件的性能和进一步应用。在本研究中,成功地制备了基于ZnO/MgO复合薄膜的Schottky UV pd。与原ZnO薄膜相比,ZnO/MgO复合薄膜的表面呈“沟壑”状。均匀大小的颗粒的积累会产生不规则的条形凸起,从而增加薄膜的表面积,从而提高其整体质量。该复合膜在330 ~ 360 nm范围内具有良好的紫外吸收性能,内阻的减小使得有利于载流子迁移的缺陷减少。这些优越的特性显著提高了器件的光电性能。值得注意的是,当施加电压从1 V增加到2 V时,器件的通/关比增加了39倍(从2.77增加到111.46),噪声等效功率(NEP)和归一化检出率(D *)分别减少和增加了一个数量级。此外,响应率提高了3倍(从0.46 mA W−1提高到1.88 mA W−1),响应时间减少了42%。该工作为开发高性能ZnO肖特基紫外光电探测器提供了新的思路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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CiteScore
6.50
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